Texas Instruments LMG3410R150-031 EVM, Руководство пользователя

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Test Setup
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14 SNOU168 – June 2019
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LMG3410R150-031 EVM User Guide
4.3 List of Test Points
Key test points on this EVM have been designed for use with oscilloscope probes with short ground
springs. Using the short ground spring instead of the alligator ground lead will minimize measurement
error and produce a cleaner signal with the fast switching GaN devices used on this EVM. The data
shown in this user guide has been obtained using such a measurement method.
Table 3. Test Point Functional Description
NAME DESCRIPTION
VAUX 12 V bias input connection before filter
ACMGND Ground for 12 V bias input before filter
5V 5 V bias
AGND1 Analog ground for logic
PWM Single input PWM signal
LDEAD1 Low side PWM signal before dead time generation
AGND3 Analog ground for logic
HDEAD1 High side PWM signal before dead time generation
AGND4 Analog ground for logic
LOW Low side PWM signal with dead time
HIGH High side PWM signal with dead time
AGND2 Analog ground for logic
12V 12 V bias after filter
PGND1 Power ground
HVIN DC input voltage
PGND2 Power ground
HVOUT DC output voltage
PGND3 Power ground
SW1 Switch node voltage
4.4 List of Terminals
Table 4. List of Terminals
TERMINAL NAME DESCRIPTION
J1 VIN Input DC voltage input
J5 VOUT Output DC voltage output
J6 12V AUX 12 V bias voltage input
J3 PWM INPUT Single 0 V to 5 V PWM input for gate
J4 LOGIC Header to connect PWM, FAULT logic
J2 HB Card PIN Connector to interface LMG3410EVM-031 board