Registers
762
SPRUH22I – April 2012 – Revised November 2019
Copyright © 2012–2019, Texas Instruments Incorporated
C28 Enhanced Pulse Width Modulator (ePWM) Module
Table 7-61. Trip-Zone Control Register Field Descriptions (continued)
Bit
Field
Value
Description
5-4
DCAEVT1
Digital Compare Output A Event 1 Action On EPWMxA:
00
High-impedance (EPWMxA = High-impedance state)
01
Force EPWMxA to a high state.
10
Force EPWMxA to a low state.
11
Do Nothing, trip action is disabled
3-2
TZB
When a trip event occurs the following action is taken on output EPWMxB. Which trip-zone pins can
cause an event is defined in the TZSEL register.
00
High-impedance (EPWMxB = High-impedance state)
01
Force EPWMxB to a high state
10
Force EPWMxB to a low state
11
Do nothing, no action is taken on EPWMxB.
1-0
TZA
When a trip event occurs the following action is taken on output EPWMxA. Which trip-zone pins can
cause an event is defined in the TZSEL register.
00
High-impedance (EPWMxA = High-impedance state)
01
Force EPWMxA to a high state
10
Force EPWMxA to a low state
11
Do nothing, no action is taken on EPWMxA.
Figure 7-112. Trip-Zone Enable Interrupt Register (TZEINT)
15
8
Reserved
R -0
7
6
5
4
3
2
1
0
Reserved
DCBEVT2
DCBEVT1
DCAEVT2
DCAEVT1
OST
CBC
Reserved
R-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 7-62. Trip-Zone Enable Interrupt Register (TZEINT) Field Descriptions
Bit
Field
Value
Description
15-3
Reserved
Reserved
6
DCBEVT2
Digital Comparator Output B Event 2 Interrupt Enable
0
Disabled
1
Enabled
5
DCBEVT1
Digital Comparator Output B Event 1 Interrupt Enable
0
Disabled
1
Enabled
4
DCAEVT2
Digital Comparator Output A Event 2 Interrupt Enable
0
Disabled
1
Enabled
3
DCAEVT1
Digital Comparator Output A Event 1 Interrupt Enable
0
Disabled
1
Enabled
2
OST
Trip-zone One-Shot Interrupt Enable
0
Disable one-shot interrupt generation
1
Enable Interrupt generation; a one-shot trip event will cause a EPWMx_TZINT PIE interrupt.
1
CBC
Trip-zone Cycle-by-Cycle Interrupt Enable
0
Disable cycle-by-cycle interrupt generation.
1
Enable interrupt generation; a cycle-by-cycle trip event will cause an EPWMx_TZINT PIE interrupt.