Tektronix TDP3500, Техническое описание

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Performance Veri fi cation
Rise Time
This procedure veri fi es that the probe meets the warranted rise time speci fi cation. Two rise times are measured; the
test system alone, and then the test system with the probe included. The probe rise time is calculated using the two
measurements.
This test uses the TDR function of the 80E04 sampling head as a fast rise time signal source. A second 80E0X sampling head
is used to take the measurements. Although the following procedure assigns the TDR and measurement functions to speci
fi c
oscilloscope channels, any channels can be used. However, the TDR function is only available on 80E04 sampling heads.
CAUTION. To prevent damage, use care when working with SMA connectors: support equipment to avoid mechanical strain
on the connectors, and when tightening connections, use a torque wrench to 7.5 in-lbs.
Test System Rise Time
1. Connect the 80E04 sampling head to Channel 1 of the sampling oscilloscope. (See Figure 11.)
2. Connect the 80E0X sampling head to Channel 8 of the sampling oscilloscope.
3. Connect SMA cables to Channels 1 and 8 on the sampling heads.
4. Connect the SMA cable from Channel 1 to an SMA-to-BNC adapter, and then to the BNC connector on the TekVPI
adapter.
5. Connect the SMA cable from Channel 8 to the SMA connector on the TekVPI adapter.
6. Turn on Channel 8 and set the vertical scale to 50 mV/div.
Figure 11: Test system rise time setup
18 TDP3500 Technical Reference