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Example: take a 3-coil inductance as an example: 1-2 capacitance of about 300P,
1-3 capacitance of about 200P and 2-3 may be in short-circuit. After short circuit,
the capacitance of 1-2 and 1-3 are in parallel connection.
1.
Do not connect any measured piece and perform GET:, result is e.g. STAN
= 100P, note down the open value.
2.
Test the standard values of several known good pieces, recording a GET data
range such as: STAN = 350P ~ 450P, note down the standard value.
3.
Short circuit 2-3 and GET a data range, e.g.: STAN = 550P ~ 650P, note
down the short circuit value.
Parameter setting calculation:
1.
Assuming STAN = 400P (center of known-good range):
2.
OPEN threshold value: lower limit of separation zone = 100P / 400P = 25%,
OPEN upper limit = 350P / 400P = 88%. It is recommended to take 40-60%.
3.
SHORT threshold value: lower limit of separation zone = 450P / 400P = 112%,
upper limit = 550P / 400P = 138%. It is recommended to take 120-130%.
4.3.5
MF multichannel assist control setup (only used in
multichannel test instruments)
STEP:
1/1
MF
SCAN:
1X2X3X4X5X6X7X8X
WAVE:
OFF
LOCK
OFST
RMT
ERR
ON
OFF
F1
F2
F3
F4
F5
Figure 4.3.5 MF setup interface
Instruction of MF scan parameters:
Scan
SCAN: 1X2X3X4X5X6X7X8X Controllable 8 output channels
X
X : this channel is open circuit
■
Full frame: this channel is connecting
with high voltage terminal
□
Empty frame: this channel is
connecting with test low terminal
Sample WAVE: ON
Connect the multichannel according to
the current SCAN value. It is
convenient to connect the external
device for performance test.
OFF
Disconnect the multichannel
