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Pin Name
TD9
TD8
XTEST1
XTEST2
XTEST3
V
SS
TRST
V
DD
TDI
TMS
TCK
TDO
V
SS
SI
SCK
XCS
XVRST
F1
V
DD
XTEST4
XRST
SYSCLK
Pin No.
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
I/O
O
O
I
I
I
–
I
–
I
I
I
O
–
I
I
I
I
I
–
I
I
I
Function
Test data bus.
In the test mode, used for internal circuit test data bus.
The test mode is allowed to use only for device vendors (Not used)
Test mode control input pin. Pulled-up.
When these pins are “H”, CXD1913Q is not in the test mode.
The test mode is allowed to use only for device vendors
Digital ground
Test mode reset input pin.
During power on/reset, set to “L” for more than 40 clocks (SYSCLK) (Not used)
Digital power supply
Test mode control input pin. (Not used)
Test mode control input pin. Fix at “H”
Test data bus pin. (Not used)
Digital ground
The functions of this pin are selected by Pin 64 XIICEN.
When the XIICEN pin is “H”, sets into the SONY SIO mode, and becomes the SI serial
data input pin.
When the XIICEN pin is “L”, sets into the I
2
C-BUS mode, and becomes the SDA input/
output pin
The functions of this pin are selected by Pin 64 XIICEN.
When the XIICEN pin is “H”, sets into the SONY SIO mode, and becomes the SCK serial
clock input pin.
When the XIICEN pin is “L”, sets into the I
2
C-BUS mode, and becomes the SCL input pin
The functions of this pin are selected by Pin 64 XIICEN. Pulled-up.
When the XIICEN pin is “H”, sets into the SONY SIO mode, and becomes the XCK chip
select input pin.
When the XIICEN pin is “L”, sets into the I
2
C-BUS mode, and becomes the SA slave
address selection input signal which selects the I
2
C-BUS slave address
Active “L” vertical sync reset input pin. Pulled-up.
Used for synchronizing external vertical sync and internal vertical sync.
When XVRST is “L”, the internal digital sync generator is reset according to the F1 state
Field ID input pin.
When externally synchronizing with the XVRST signal, the field to be reset is determined
by this signal.
“H” indicates the first field.
“L” indicates the second field
Digital power supply
Test mode control input pin. Pulled-up.
When these pins are “H”, CXD1913Q is not s test mode.
The test mode is allowed to use only for device vendors
System reset input pin when active “L”.
During power on/reset, set to “L” for more than 40 clocks (SYSCLK)
System clock input pin.
To generate the correct sub carrier frequency, precisely 27MHz is required