Silicon Laboratories Si4010-C2, Руководство пользователя

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Si4010-C2
28 Rev. 1.0
10. Electrical Characteristics
Table 10.1. Recommended Operating Conditions
Parameter Symbol Test Condition Min Typ Max Unit
Supply Voltage V
DD
1.8 — 3.6 V
Supply Voltage Slew Rate Initial Battery Insertion* 20 — 650 mV/
us
Ambient Temperature T
A
–40 25 85 °C
Digital Input Range Digital Input Signals –0.3 — V
DD
+
0.3
V
*Note:
Recommend bypass capacitor = 1 µF; slew rate measured 1 V < V
DD
,< 1.7 V.
Table 10.2. Absolute Maximum Ratings
1,2
Parameter Symbol Value Unit
Supply Voltage V
DD
–0.5 to 3.9 V
Input Current
3
I
IN
10 mA
Input Voltage
4
V
IN
–0.3 to (V
DD
+ 0.3) V
Junction Temperature T
J
–40 to 90

C
Storage Temperature T
STG
–55 to 150

C
Notes:
1.
Permanent device damage may occur if the absolute maximum ratings are exceeded. Functional operation
should be restricted to the conditions as specified in the operational sections of this data sheet. Exposure
beyond recommended operating conditions for extended periods may affect device reliability.
2.
Handling and assembly of these devices should only be done at ESD-protected workstations.
3.
All input pins besides V
DD
.
4.
For GPIO pins configured as inputs.