TB-9023
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© 2017 DESCO INDUSTRIES, INC.
Employee Owned
SCS
- 926 JR Industrial Drive, Sanford, NC 27332 • (919) 718-0000 • Website:
StaticControl.com
ESD Event Detection Sensor
The SCS EM Eye Meter will help you detect most ESD
events. This will help you make sound decisions in
tackling what may have been a daunting task. The EM
Eye Meter detects the magnitude of events and using
the filters built into the unit. It can provide approximate
values for some ESD Events for models (CDM, MM,
HBM) using proprietary algorithms. Switching between
any of the modes will give you immediate data analysis.
Solving ESD problems requires data; a before-and-after
analysis of data may now be measured and used to
tailor ESD control programs.
CDM Mode
MM Mode
In IC testing, ICs that are
sliding through tubes may
be charged up. Once the
lead touches the metal
tracks, a CDM event can
occur.
A moving, ungrounded
cart may accumulate
charges in its path. As
it approaches a metallic
worktable and bumps
into it, a discharge may
occur and may adversely
affect nearby products or
instruments
In feeder bowls where the
ICs are arranged for sort-
ing or orientation, voltages
may be induced by the
vibrating bowl.
In using a bad soldering
iron, induced voltages
may cause discharges to
the components mounted
into the PCB. Use ground-
ed tools and confirm that
no ESD events will be
detected by using the MM
mode.
HBM Mode
Raw Input Mode
In IC testing, operators
that are handling an IC
(i.e. fixing bent leads) may
be discharging through
the IC.
For engineers who want
to simply analyze raw
ESD signals for further
analysis, the Raw Input
mode provides actual
voltages received by an
antenna.
During picking up of an IC
by a person not properly
wearing a wrist strap, use
the EM Eye Meter to
alarm the operator of such
events.
