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User’s Guide
HB2637L-EVK-301
© 2022 ROHM Co., Ltd.
No. 65UG002E Rev.001
Apr. 2022
Test Point
Purpose
Location
TP1
High side PWM input
LV Side
TP2
Low side PWM input
LV Side
TP3
High side gate
HV Side
TP4
High side driver source
HV Side
TP5
Low side gate
HV Side
TP6
Low side driver source
HV Side
TP7
High side drain
HV Side
TP8
High side source
HV Side
TP9
Low side drain
HV Side
TP10
Low side source
HV Side
Table 1 : Test points on the board and purpose
For gate source monitoring using optical probes for example, single pin headers that act as receptacles can be soldered on test
points TP3, TP4, TP5 and TP6.
Figure 9 shows the locations of the test points on the board.
Figure 9: Top view of the board with the test point locations
3.6 Device Current Measurement
For low side device current measurement using Rogowski coil, two slots are provided through which the probe can be inserted.
Rogowski coil probes with various loop and wire diameters are available. The slots provided mainly fit the probe loop of 25mm
diameter and wire diameter of 1.7mm. Figure 10 depicts the usage of a Rogowski coil for current measurements. For device
current measurement using Rogowski coil, it is mandatory to short the jumper J1.
TP1
TP2
TP7
TP8
TP10
TP9
TP5
TP6
TP3
TP4
