R01UH0822EJ0100 Rev.1.00
Page 1017 of 1041
Jul 31, 2019
RX13T Group
32. Electrical Characteristics
32.5
A/D Conversion Characteristics
Note:
The characteristics apply when no pin functions other than A/D converter input are used. Absolute accuracy includes
quantization errors. Offset error, full-scale error, DNL differential nonlinearity error, and INL integral nonlinearity error do not
include quantization errors.
Note 1. The conversion time is the sum of the sampling time and the comparison time. As the test conditions, the number of sampling
states is indicated.
Table 32.32
A/D Conversion Characteristics (1)
Conditions: VCC = 4.5 V to 5.5 V, AVCC0 = VCC to 5.5 V, VSS = AVSS0 = 0 V, T
a
= –40 to +105°C, Source impedance =
1.0 kΩ
Item
Min.
Typ.
Max.
Unit
Test Conditions
Frequency
1
—
32
MHz
Resolution
—
—
12
Bit
Conversion time*
(Operation at
PCLKD = 32 MHz)
Sample-and-hold circuit
not in use
1.41
—
—
μs
High-precision channel
ADSSTRn.SST[7:0] bits = 0Dh
Sample-and-hold circuit
in use
2.16
—
—
High-precision channel
ADSSTRn.SST[7:0] bits = 0Dh
ADSHCR.SSTSH[7:0] bits = 0Bh
AN000 to 002 = 0.25 V to AVCC0 –
0.25 V
Analog input capacitance
—
—
12
pF
Offset error
Sample-and-hold circuit
not in use
—
±0.5
±4.5
LSB
Sample-and-hold circuit
in use
—
±1.5
±6.5
Full-scale error
Sample-and-hold circuit
not in use
—
±0.75
±4.5
LSB
Sample-and-hold circuit
in use
—
±1.5
±6.5
Quantization error
—
±0.5
—
LSB
Absolute accuracy
Sample-and-hold circuit
not in use
—
±1.25
±5.0
LSB
Sample-and-hold circuit
in use
—
±3.0
±8.0
AN000 to 002 = 0.25V to AVCC0 –
0.25
DNL differential nonlinearity error
—
±0.5
±1.5
LSB
INL integral nonlinearity error
—
±1.5
±4.0
LSB