Panasonic TC-21FX30LA, Руководство по обслуживанию

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TC-21FX30LA/LP / TC-29FX30LA/LP
CRT
21”
29”
[* A]
10
μ
m ±5
0
μ
m ±5
ADJUSTMENTS
Fig. 1
1 2 3 3 2 1
Fig. 2
9- FOCUS CALIBRATION
• Assure that the SUB-BRIGHTNESS adjustment has been
done.
1. Supply a Philips or monoscope pattern signal.
2.
Adjust IMAGE MENU to DYNAMIC NORMAL.
CALIBRATION :
1. Adjust the FOCUS variable resistor for the point of better
adjustment.
•
with PHILIPS signal .... take as reference for adjustment
the third vertical line (fig. 1).
•
with MONOSCOPE signal in the number 4 (fig.2).
8- SUB-BRIGHT AND SUB-CONTRAST
CALIBRATION
1.
Supply a WINDOW pattern signal
.
2. Adjust IMAGE MENU to DYNAMIC NORMAL
SUB-BRIGHT CALIBRATION
1. Position the color analyzer in the LOW LIGHT image
area.
2. Ajust S-BRT <CHK 4> control, so that it is Y=0,7±0,2.
SUB-CONTRAST CALIBRATION
1. Position the color analyzer in the HIGH LIGHT image
area.
2. Ajust S-CONT <CHK 4> DAC control, so that it is
Y=230±10 for 20” CRT and Y=380±20 for 14” CRT.
3. If impossible to obtain that adjustment, adjust SUB-
CONT <CHK 4> again.
4. Check the SUB-BRIGHT adjust.
10- PURITY CALIBRATION
1. Adjust the HELMHOLTZ device for the local magnetic field
(HORIZONTAL: 0 ± 0.03 X 10-4T)
2. Let the set warm up (aging time) for a minimum of 60
minutes.
3. Supply a purity pattern (white pattern).
4. Adjust CONTRAST and BRIGHT to MAXIMUM.
5. The static convergence adjustment must have been
made preliminarily.
6. Connect a DC ampere meter between FBT pin11 (-) and
FBT pin3 (+), and adjust to 920
μ
A±10%, varying the S-
BRT DAC control.
CALIBRATION
:
1. Position the “ears” of the purity magnets both upward.
2. Adjust the purity until the markers in the purity jig
monitorscope becomes symmetrical in the horizontal
direction.
3. The vertical centralization correction is made through
the purity magnets for stripe CRT type only.
4. Slide the yoke forward by 10 mm±5 in the monitor. Then,
tighten the deflection yoke.
5. Repeat the procedures 2 ~ 3 ~ 4.
6. Press the belt of deflection yoke.
7. Adjust “beam landing” using a microscope. (for model
change or instrument check only)
4
ITEM / PREPARATION PROCEDURE