3. Use the page buttons to select the respective test.
Fig.10
8.1. ROM device test
Fig.11
- Press the EXECUTE button to begin the test.
- The test result (OK or NG) is displayed within twenty seconds. If
the test result is NG, not only the respective IC, but also a break or
short circuit in the ADDRESS/DATA BUS as well as in any of the
strobe signal lines may be the causeof thefailure.(refer to
Fig.11
)
8.2. RAM device test
Fig.12
13
Содержание SX-KN2600P
Страница 22: ...SYMBOL SPECIFICATION TYPE Multilayer Ceramic Chip Capacitors ECUV_type 10 MEASURING CONDITION 22 ...
Страница 27: ...A3 QJAG027AB AC CORD 1 EX EG EH EQ GU GT GM 27 ...
Страница 40: ...R625 ERDS2TJ124T 120K 1 40 ...
Страница 42: ...R691 92 ERDS2TJ223T 22K 2 42 ...
Страница 46: ...Ref No Part No Part Name Description Pcs Remarks 16 Cabinet Parts Location 46 ...
Страница 47: ...17 Control Panel Parts Location 47 ...
Страница 48: ...18 Packaging 48 ...
Страница 49: ...19 Schematic Diagram for printing with A4 S030500000 HM AM 49 ...