ON Semiconductor NB7L216MNEVB, Руководство пользователя

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© Semiconductor Components Industries, LLC, 2012
February, 2012 − Rev. 1
1 Publication Order Number:
EVBUM2085/D
NB7L216MNEVB
NB7L216 Evaluation Board
User's Manual
Description
This document describes the NB7L216 evaluation board
and the appropriate lab test setups. It should be used in
conjunction with the NB7L216 data sheet which contains full
technical details on the device specifications and operation.
The evaluation board is designed to facilitate a quick
evaluation of the NB7L216 GigaComm
t
High Gain
Differential Receiver/Driver.
Board Lay − up
The evaluation board is implemented in two layers and
provides a high bandwidth 50 W controlled impedance
environment for higher performance. First layer or primary
trace layer is 5 mils thick Rogers RO6002 material, which
is engineered to have equal electrical length on all signal
traces from NB7L216 device to the sense output. The second
layer is 32 mils thick copper ground plane. For standard lab
setup and test, a split (dual) power supply is required
enabling the 50 ohm impedance in the scope to be used as
termination of the ECL signals (V
TT
= V
CC
– 2.0 V, in split
power supply setup, V
TT
is the system ground).
What measurements can you expect to make?
With this evaluation board, the following measurements
could be performed in single − ended
(1)
or differential modes
of operation:
•
Jitter
•
Output Skew
•
Gain/Return Loss
•
Eye Pattern Generation
•
Frequency Performance
•
Output Rise and Fall Time
•
V
CMR
(Common Mode Range)
1. Single − ended measurements can only be made at
V
CC
− V
EE
= 3.3 V using this board setup.
Figure 1. NB7L216 Evaluation Board
http://onsemi.com
EVAL BOARD USER’S MANUAL