46
SPECTANO 100 User Manual
10.4.2 Correction procedure
You can perform the procedure for correcting the measured material capacitance before or after
performing the material measurements. In both cases, the error correction proceeds as follows:
1
In the Navigation pane, click
Material measurement(s)
, the
Graph and result table
opens automatically
.
2
Click the
Reference
button
on the ribbon to correct all measurements. (For the
calculation logic, see chapter 10.4.3 "Correction logic and calculation" ). Then all
measurements in the
Navigation
will be marked with the following icon (corrected),
and the icon of the button will change to , indicating that the correction is active.
3
To deactivate the correction again, click the
Reference
button
. Then all
measurement results will be reset to the original data (not corrected), the icon in the
Navigation
changes back to performed , and the icon of the button will change to
,
indicating that the correction is deactivated.
10.4.3 Correction logic and calculation
Disk electrodes and DSH 100 Dielectric Sample Holder
The following reference measurement procedure applies to the disk electrodes.
For the cylindrical electrodes and other geometries, see "Cylindrical electrodes
and other geometries" later in this section.
The correction logic and calculation differ depending on whether the reference
sample thickness is equal to the sample thickness of all material measurements
or the sample thickness for at least one material measurement is not equal to
the reference sample thickness.
Reference sample
thickness is equal
to the material
sample thickness
Reference sample
thickness is not
equal to the
material sample
thickness
In this case, only one reference measurement is to be performed. If you click the
Reference
button
on the ribbon, the capacitance results and thus the
permittivity, tanδ and the impedance results of all measurements displayed in
the navigation pane, will be corrected according to the following formulas:
c
’
u
(air) =
c
’
meas.
(air) –
c
0
(air)
(Eq. 10-1)
c’
’
u
(air) =
c’
’
meas.
(air)
(Eq. 10-2)
c
’
corrected
(material) =
c
’
meas.
(material) –
c’
u
(air)
(Eq. 10-3)
c’
’
corrected
(material) =
c’
’
meas.
(material) –
c’’
u
(air)
(Eq. 10-4)
where
c
u
is unknown stray capacitance.
Note:
If you add a new measurement with the sample thickness
h
not equal to
the reference sample thickness after activating the correction of the
measurement results, the correction will be deactivated, and all corrected
measurements will be reset to the non-corrected results.
In this case, both reference measurements have to be performed. If you click the
Reference
button
on the ribbon, the capacitance results and thus the
permittivity, tanδ and the
impedance results of all measurements, displayed in
the navigation pane, will be corrected by using linear interpolation of the
reference measurement results. By interpolating the results, an approximate
value of
c
u
(
t
) for the actual sample thickness
h
is found.
