Olympus Vanta iX Series, Руководство по установке

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10-019116-01EN, Rev. 2, January 2021
Specifications 59
Appendix A: Specifications
This appendix outlines the specifications for the Vanta iX XRF analyzer, its docking
station, and its accessories (Table 9 on page 59 and Table 10 on page 60).
Table 9 Analyzer specifications
Item Specifications
Excitation source X-ray tube — Rh or W anode (application optimized) 5–200 µA
MR: 8–50 keV (4 W max)
VCW: 8–40 keV (4 W max)
Primary beam filtration Eight filter positions automatically selected per beam per
method
Detector M series: Large area silicon drift detector
C series: Silicon drift detector
Power requirements DC power in: 10–18 V DC, 3.9 A
OR
Power over Ethernet (PoE+) 18 V DC, 30W
Elemental range MR = Mg–U
VCW = Ti–U (with standard window and calibration)
Pressure correction Built-in barometer for automatic altitude and air pressure
correction
Operating environment Temperature
–10 °C to +50 °C continuous duty cycle
Humidity: 10 % to 90 % relative humidity, noncondensing
IP rating IP54
Operating system Linux
Application software Olympus proprietary data acquisition and processing package
USB interface USB 2.0 type A host port for accessories such as USB flash drives