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Table 57. Thermal characteristics for the 176-pin LQFP package (continued)
Rating
Conditions
Symbol
Value
Unit
Junction to Ambient (@200 ft/min)
,
Single layer board (1s)
R
θ
JMA
37.8
°C/W
Junction to Ambient (@200 ft/min)
,
Four layer board (2s2p)
R
θ
JMA
28.2
°C/W
Junction to Board
—
R
θ
JB
21.0
°C/W
—
R
θ
JC
7.8
°C/W
Natural Convection
ψ
JT
0.3
°C/W
Junction to Package Lead
Natural Convection
ψ
JB
13.0
°C/W
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
2. Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3. Per JEDEC JESD51-6 with the board horizontal.
4. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured
on the top surface of the board near the package.
5. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
6. Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2.
7. Thermal characterization parameter indicating the temperature difference between package bottom center and the junction
temperature per JEDEC JESD51-12.
Table 58. Thermal characteristics for the 252-pin MAPBGA package with full solder balls
Rating
Conditions
Symbol
Value
Unit
Junction to Ambient Natural Convection
Single layer board (1s)
R
θ
JA
43.0
°C/W
Junction to Ambient Natural Convection
,
,
Four layer board (2s2p)
R
θ
JA
26.5
°C/W
Junction to Ambient (@200 ft/min)
,
Single layer board (1s)
R
θ
JMA
33.2
°C/W
Junction to Ambient (@200 ft/min)
,
Four layer board (2s2p)
R
θ
JMA
22.2
°C/W
Junction to Board
—
R
θ
JB
12.5
°C/W
—
R
θ
JC
6.3
°C/W
Natural Convection
ψ
JT
0.3
°C/W
Junction to Package Lead
Natural Convection
ψ
JB
8.7
°C/W
1. Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site
(board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board
thermal resistance.
2. Per SEMI G38-87 and JEDEC JESD51-2 with the single layer board horizontal.
3. Per JEDEC JESD51-6 with the board horizontal.
4. Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured
on the top surface of the board near the package.
5. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883
Method 1012.1).
6. Thermal characterization parameter indicating the temperature difference between package top and the junction
temperature per JEDEC JESD51-2.
Thermal characteristics
SPC5746R Microcontroller Data Sheet, Rev. 6, 06/2017
88
NXP Semiconductors