Table 16. Selectable load capacitance (continued)
load_cap_sel[4:0] from DCF record
Capacitance on EXTAL (C
EXTAL
)/XTAL (C
XTAL
)
,
01111
15.0
10000-11111
N/A
1. Values are determined from simulation across process corners and voltage and temperature variation. Capacitance values
vary ±12% across process, 0.25% across voltage, and no variation across temperature.
2. Values in this table do not include the internal stray capacitances C
xtal
/C
extal
.
V
A
I
XTAL
Bias
XTAL
EXTAL
VSSOSC
VSS
Tester
PCB
GND
Current
Comparator
OFF
Z = R + j L
Conditions
V
V
ALC INACTIVE
EXTAL
XTAL
=0 V
=0 V
V
ALC
DDOSC
Figure 9. Test circuit
Table 17. Internal RC Oscillator electrical specifications
Symbol
Parameter
Conditions
Value
Unit
Min
Typ
Max
f
Target
IRCOSC target frequency
—
—
16
—
MHz
δ
f
var_noT
IRC frequency variation without
temperature compensation
T < 150 °C
–8
—
8
%
δ
f
var_T
IRC frequency variation with
temperature compensation
T < 150 °C
–3
—
3
%
δ
f
var_SW
IRC software trimming accuracy
Trimming
temperature
–1
—
1
%
δ
f
TRIM
IRC software trimming step
—
—
+40/-48
—
kHz
T
start_noT
Startup time to reach within fvar_noT
Factory trimming
already applied
—
—
5
µs
T
start_T
Startup time to reach within f
var_T
Factory trimming
already applied
—
—
120
µs
Table continues on the next page...
Oscillator and FMPLL
SPC5746R Microcontroller Data Sheet, Rev. 6, 06/2017
NXP Semiconductors
25