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Chapter 35 IEEE 1149.1 Test Access Port Controller (JTAGC)
MPC5606BK Microcontroller Reference Manual, Rev. 2
Freescale Semiconductor
947
35.5.2.1
Bypass mode
When no test operation is required, the BYPASS instruction can be loaded to place the JTAGC into bypass
mode. While in bypass mode, the single-bit bypass shift register is used to provide a minimum-length
serial path to shift data between TDI and TDO.
35.5.2.2
TAP sharing mode
There are three selectable auxiliary TAP controllers that share the TAP with the JTAGC. Selectable TAP
controllers include the PLATFORM. The instructions required to grant ownership of the TAP to the
auxiliary TAP controllers are ACCESS_AUX_TAP_ONCE and ACCESS_AUX_TAP_TCU. Instruction
opcodes for each instruction are shown in
.
When the access instruction for an auxiliary TAP is loaded, control of the JTAG pins is transferred to the
selected TAP controller. Any data input via TDI and TMS is passed to the selected TAP controller, and any
TDO output from the selected TAP controller is sent back to the JTAGC to be output on the pins. The
JTAGC regains control of the JTAG port during the UPDATE-DR state if the PAUSE-DR state was
entered. Auxiliary TAP controllers are held in RUN-TEST/IDLE while they are inactive.
35.6
External signal description
The JTAGC consists of four signals that connect to off-chip development tools and allow access to test
support functions. The JTAGC signals are outlined in
:
The JTAGC pins are shared with GPIO. TDO at reset is a input pad and output direction control from
JTAGC. Once TAP enters shift-ir or shift-dr then output direction control from JTAGC, which allows the
value to see on pad. It is up to the user to configure them as GPIOs accordingly.
35.7
Memory map and register description
This section provides a detailed description of the JTAGC registers accessible through the TAP interface,
including data registers and the instruction register. Individual bit-level descriptions and reset states of
each register are included. These registers are not memory-mapped and can only be accessed through the
TAP.
35.7.1
Instruction register
The JTAGC uses a 5-bit instruction register as shown in
. The instruction register allows
instructions to be loaded into the module to select the test to be performed or the test data register to be
Table 35-1. JTAG signal properties
Name
I/O
Function
Reset State
TCK
I
Test clock
Pull Up
TDI
I
Test data in
Pull Up
TDO
O
Test data out
High Z
TMS
I
Test mode select
Pull Up
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