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NVM Electrical Parameters
MC9S12VRP Family Reference Manual Rev. 1.3
NXP Semiconductors
527
I.2
NVM Reliability Parameters
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The data retention and program/erase cycling failure rates are specified at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
Table I-2. NVM Reliability Characteristics
NUM
Rating
Symbol
Min
Typ
Max
Unit
Program Flash Arrays
1
Data retention at an average junction temperature of T
Javg
= 85
C
1
after up to 10,000 program/erase cycles
1
T
Javg
does not exceed 85
C in a typical temperature profile over the lifetime of a consumer, industrial or automotive
application.
t
NVMRET
20
100
2
2
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25
C using the Arrhenius equation. For additional information on how NXP defines Typical Data Retention, please refer to
Engineering Bulletin EB618
—
Years
2
Program Flash number of program/erase cycles
(-40
C
Tj
150
C
n
FLPE
10K
100K
3
3
Spec table quotes typical endurance evaluated at 25
C for this product family. For additional information on how NXP defines
Typical Endurance, please refer to Engineering Bulletin EB619.
—
Cycles
Data Flash Array
3
Data retention at an average junction temperature of T
Javg
= 85
C
after up to 50,000 program/erase cycles
t
NVMRET
5
100
—
Years
4
Data retention at an average junction temperature of T
Javg
= 85
C
after up to 10,000 program/erase cycles
t
NVMRET
10
100
—
Years
5
Data retention at an average junction temperature of T
Javg
= 85
C
after less than 100 program/erase cycles
t
NVMRET
20
100
—
Years
6
Data Flash number of program/erase cycles (-40
C
Tj
150
C
n
FLPE
50K
500K
—
Cycles
Содержание MC9S12VRP64
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Страница 436: ...Supply Voltage Sensor BATSV2 MC9S12VRP Family Reference Manual Rev 1 3 436 NXP Semiconductors ...
Страница 488: ...64 KByte Flash Module S12FTMRG64K4KV2 MC9S12VRP Family Reference Manual Rev 1 3 488 NXP Semiconductors ...
Страница 528: ...NVM Electrical Parameters MC9S12VRP Family Reference Manual Rev 1 3 528 NXP Semiconductors ...
Страница 529: ...MC9S12VRP Family Reference Manual Rev 1 3 NXP Semiconductors 529 Appendix J Package Information ...
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Страница 531: ...Package Information MC9S12VRP Family Reference Manual Rev 1 3 NXP Semiconductors 531 ...
Страница 532: ...Package Information MC9S12VRP Family Reference Manual Rev 1 3 532 NXP Semiconductors ...