The test copies a block of memory to the backup area defined by the linker. Be sure that the BLOCK_SIZE parameter is smaller
than the backup area defined by the linker.
This test cannot be interupted.
NOTE
6.7 Program counter test
The CPU program counter register test procedure tests the CPU program counter register for the stuck-at condition. The program
counter register test can be performed once after the MCU reset and also during runtime.
The program counter test cannot be interrupted.
NOTE
6.8 Stack test
This test routine is used to test the overflow and underflow conditions of the application stack. The testing of the stuck-at faults in
the memory area occupied by the stack is covered by the variable memory test. The overflow or underflow of the stack can occur
if the stack is incorrectly controlled or by defining the "too-low" stack area for the given application.
Choose a correct pattern to fill the tested area. This pattern must be unique to the application.
NOTE
6.9 Watchdog test
The watchdog test provides the testing of the watchdog timer functionality. The test is run only once after the reset. The test causes
the WDOG reset and compares the preset time for the WDOG reset to the real time.
For this test to run correctly, it is necessary to keep the WDOG_backup variable in a part of memory which is not corrupeted by
the WDOG reset.
Some debuggers do not allow the WDOG reset. Due to this, it is necessary to turn off the WDOG when debugging
the application.
NOTE
Program counter test
LPC CM0 Safety Example , Rev. 3, 07/2021
NXP Semiconductors
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