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KIT33771TPLEVB evaluation board,
Rev. 2.0
10
NXP Semiconductors
Getting to know the hardware
3.7
Test point definitions
Figure 5
shows the location of the test points on the board.
Figure 5. Test points
The following test points provide access to various signals to and from the board.
Table 3. Test points
Test point name
Signal name
Description
RTDX_IN_N
SI/RDTX_IN-
Measures the isolated pulse communication sent to the device
RTDX_IN_P
SCLK/
RTDX_OUT_N
RTDX_OUT-
RTDX_OUT_P
R
NEG_BATT
GNDREF
Ground reference of the device
POS_BATT
V
BAT
Positive V
BAT
RDTX_OUT_N
RDTX_IN_N
RDTX_IN_P
NEG_BATT
RDTX_OUT_P
POS_BATT