
445N
2
7. Adjustment Procedure
7.1. Adjustment Flow Diagram
7.2. Preliminary Preparations
7.2.1. High Voltage
7.2.2. Coarse Width
7.3. Geometry
7.4. Grey Scale
7.4.1. The Most Dominant Colour
7.4.2. Low Light
7.4.3. High Light
7.5. Maximum/Minimum Contrast
7.6. Focus
7.7. Convergence
7.7.1. Measuring Conditions
7.7.2. Convergence Measuring Gauge
7.7.3. Static Convergence
7.7.4. Dynamic Convergence
7.7.5. Allowed Error Levels for Convergence
7.8. Installing serial number to processor
7.9. Magnet rings
7.10. Beamlanding
8. Screen and Faceplate Blemishes
8.1. Definitions of inspection conditions and terms
8.1.1. Standard observing condition
8.1.2. Zone division
8.1.3. Minimum distance beetween defects
8.1.4. Average diameter of defect
8.2. Face defect standard (black spot, stain)
8.3. Glass blemish
8.3.1. Scratch
8.3.2. Bubbles/foreign materials
Revision History
Rev
Date
Prepared by
Comments
01.00
14.01.00
Содержание 445PRO
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