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3.3.3 The Input Range Select (IRS) Pin 

This pin has three states which the following table summarizes: 

 

JP1 Jumper 

setting 

IRS State 

Input Voltage 

Range 

(differential) 

Pins 1&2 

VDDA 

2Vpp 

Pins 3&4 

VSSA 

1.5Vpp 

Open Floating  1.0Vpp 

 

 

 

3.3.4 Power Supply Connections

 

Power to this board is supplied through power connector JS1. Table 
1 describes the pin out, and the allowed voltage ranges 

4.0 Obtaining Best Results 

Many factors go into reasonable data capture when evaluating an 
ADC. These include, but are not limited to, such things as PCB 
layout, clock timing, the ratio between the input frequency and 
sample rate and the FFT windowing technique. 

Here we include very brief discussions on clock timing adjustments 
as it relates to the ADC10080 and of sampling and FFT windowing. 

4.1 Clock Timing 

Because of differing delays in the clock signal and the data from the 
ADC, at some sample rates the data from the ADC may be latched 
as it is changing, leading to corrupted data, one example of which is 
seen in 

Figure 2

, which shows the poor data capture of a 4.7MHz 

signal at 12.5Msps that results from poor timing of the clock and 
external latch signals relative to each other. 

 

 

Figure 2. Bad data capture of a 4.7MHz input signal at 
12.5Msps due to attempted capture at data transition. 

 

 

 

 

 

 

 

 

 

 

 

 

 

Figure 3 shows a successful data capture of a 4.7MHz input signal 
at 12.5Msps with a shorting jumper on JS1. 

 

 

Figure 3. A good data capture of a 4.7MHz input 
signal at 12.5Msps 

 

4.2 Coherent Sampling 

Artifacts can result when we perform an FFT on a digitized 
waveform, producing inconsistent results when performing repeated 
testing. The presence of these artifacts means that the ADC under 
test may perform better than the measurements would indicate. 

We can eliminate the need for windowing and get more consistent 
results if we observe the proper ratios between the input and 
sampling frequencies. This greatly increases the spectral resolution 
of the FFT, allowing us to more accurately evaluate the spectral 
response of the A/D converter. When we do this, however, we must 
be sure that the input signal has high spectral purity and stability 
and that the sampling clock signal is extremely stable with minimal 
jitter. 

Coherent sampling of a periodic waveform occurs when a prime 
integer number of cycles exists in the sample window. The 
relationship between the number of cycles sampled (CY), the 
number of samples taken (SS), the signal input frequency (fin) and 

the sample rate (fs), for coherent sampling, is 

CY
SS

f

in

f

s

=

 

CY, the number of cycles in the data record, must be a prime 
integer number and SS, the number of samples in the data record, 
must be a factor of 2 integer. 

Further, fin (signal input frequency) and fs (sampling rate) should be 

locked to each other. If these frequencies are locked to each other,

 

whatever frequency instability (jitter) is present in one of the signal 
is present in the other signal and these jitter terms will cancel each 
other. 

Windowing (an FFT Option under WaveVision™) should be turned 
off for coherent sampling. The results of coherent sampling can be 
seen in the FFT plot seen in 

Figure 4

. Note how narrow is the bin 

(how fine are the lines) in this plot as compared with the plots of 

Figures 5

 through 

7

 

Figure 4. Coherent sampling will indicate accurate 
dynamic performance of the ADC 

4.3 FFT Windowing Technique 

Содержание ADC10040

Страница 1: ... May 9 2005 Rev 1 3 Evaluation Board User s Guide ADC10040 10 Bit 40 MSPS 3 Volt 55 5 mW A D Converter ADC10065 10 Bit 65 MSPS 3 Volt 68 5 mW A D Converter ADC10080 10 Bit 80 MSPS 3 Volt 78 6 mW A D Converter 2005 National Semiconductor Corporation ...

Страница 2: ...Input 3 3 2 Digital Data Output 3 3 3 ADC10080 Control Pins 3 3 3 1 The Standby STBY Pin 3 3 3 2 The Data Format DF pin 3 3 3 3 The Input Range Select IRS Pin 4 3 3 4 Power Supply Connections 4 4 0 Obtaining Best Results 4 4 1 Clock Timing 4 4 2 Coherent Sampling 4 4 3 FFT Windowing Technique 4 5 0 Hardware Documentation 6 ...

Страница 3: ...aveVision tm software can be obtained from http www national com 2 Select the input voltage range by inserting a jumper into JP1 Set the jumper on pins 1 2 for 2 0 Vpp Set the jumper on pins 2 3 for 1 5 Vpp If no jumper is inserted 1 0 Vpp is assumed 3 To make the ADC10080 active insure there is no jumper on JP3 4 Select pins 2 3 on JP2 so that the output data is offset binary 5 Connect a clean po...

Страница 4: ...oducing inconsistent results when performing repeated testing The presence of these artifacts means that the ADC under test may perform better than the measurements would indicate We can eliminate the need for windowing and get more consistent results if we observe the proper ratios between the input and sampling frequencies This greatly increases the spectral resolution of the FFT allowing us to ...

Страница 5: ...the input frequency This spreading is called leakage Figure 5 A discontinuity in the folded finite time waveform leads to misleading results in the FFT There are many windowing techniques in use today to minimize this problem Figure 6 shows an FFT plot of the same data used in Figure 5 but using the Hanning windowing function Note the improved dynamic performance over no windowing as in Figure 5 T...

Страница 6: ...6 http www national com 5 0 Hardware Documentation Please see the attached pages for a board layout hardware schematic and Bill of Materials ...

Страница 7: ...7 http www national com ...

Страница 8: ...7 1 C27 0 1uF 8 2 JP1 JP2 HEADER 3 9 1 JP3 HEADER 2 10 1 JP4 Logic Analyzer 11 1 JS1 CONN TRBLK 4 12 1 J1 Vert PCB mount 13 1 J2 FUTUREBUS_96 14 4 L1 L2 L3 L4 EXC CET103U 15 4 R1 R5 24 9 16 1 R4 49 9 17 1 R6 100K 18 11 R7 R8 R9 R10 R11 R12 R13 49 9 R14 R15 R16 R17 19 1 TP1 CLOCK 20 1 TP2 VIN 21 1 TP3 VCOM 22 1 TP4 VIN 23 1 TP5 VIN 24 1 TP6 VDDA 25 2 TP7 TP8 GND 26 1 TP9 VDDIO 27 1 TP10 VCC_Bfr 28 ...

Страница 9: ...SIDENT OF NATIONAL SEMICONDUCTOR CORPORATION As used herein 1 Life support devices or systems are devices or systems which a are intended for surgical implant into the body or b support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in a significant injury to the user 2 A critical...

Страница 10: ...for use in safety critical applications such as life support where a failure of the TI product would reasonably be expected to cause severe personal injury or death unless officers of the parties have executed an agreement specifically governing such use Buyers represent that they have all necessary expertise in the safety and regulatory ramifications of their applications and acknowledge and agre...

Страница 11: ...Mouser Electronics Authorized Distributor Click to View Pricing Inventory Delivery Lifecycle Information Texas Instruments ADC10080EVAL ...

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