No
Item
Test Method
14 Resistance to
The measured and observed characteristics shall satisfy Preheat the capacitor at 120 to 150
℃
for 1 minute.
Soldering Heat
the specifications in the following table.
Immerse the capacitor in an eutectic solder solution or
Appearance
No defects or abnormalities.
Sn-3.0Ag-0.5Cu solder solution at 270+/-5
℃
for
10+/-0.5 seconds. Let sit at room temperature for 24+/-2
Capacitance
Within
±
2.5% or
±
0.25 pF
hours.
Change
(Whichever is larger)
Q
30pFmin.:Q
≧
1400
30pFmax.:Q
≧
800+20C
C:NominalCapacitance (pF)
I.R.
More than 10,000MΩ
Dielectric
No defects.
Strength
15 Temperature
The measured and observed characteristics shall satisfy Fix the capacitor to the supporting jig in the same
Cycle
the specifications in the following table.
manner and under the same conditions as (10).
Appearance No defects or abnormalities.
Perform the five cycles according to the four heat
treatments listed in the following table.
Capacitance Within
±
2.5% or
±
0.25pF
Let sit for 24+/-2 hours at room temperature, then measure.
Change
(Whichever is larger)
Q
30pFmin. : Q
≧
1400
30pFmax.: Q
≧
800+20C
C:NominalCapacitance (pF)
I.R.
More than 10,000MΩ
Dielectric
No defects.
Strength
16 Humidity
The measured and observed characteristics shall satisfy Sit the capacitor at 40
±
2
℃
and 90 to 95% humiduty for
Steady
State
the specifications in the following table.
500
±
12 hours.
Appearance
No defects or abnormalities.
Remove and let sit for 24
±
2 hours (temperature compensating type)
at room temperature, then measure.
Capacitance
Within
±
5
％
or
±
0.5pF
Change
(Whichever is larger)
Q
30pF and over : Q
≧
350
10pF and over, 30pF and below : Q
≧
275+5C/2
C:Nominal Capacitance(pF)
I.R.
More than 1,000MΩ
17 Humidity
Load
The measured and observed characteristics shall satisfy Apply the rated voltage at 40±2
℃
and 90 to 95% humidity
the specifications in the following table.
for 500±12 hours.
Appearance
No defects or abnormalities.
Remove and let sit for 24±2 hours at room temprature then
muasure. The charge/discharge current is less than 50mA.
Capacitance
Within
±
7.5% or
±
0.75pF
Change
(Whichever is larger)
Q
30pF and over : Q
≧
200
30pF and below : Q
≧
100+10C/3
I.R.
More than 500MΩ
18
The measured and observed characteristics shall satisfy Apply 200% of the rated voltage for 1000
±
12 hours at the
Load
the specifications in the following table.
maximun operating temperature
±
3
℃
.
Appearance
No defects or abnormalities.
Let sit for 24
±
2 hours (temperature compensating type) a
ｔ
room temperature, then measure.
Capacitance
Within
±
3% or
±
0.3pF
The charge/discharge current is less than 50mA
Change
(Whichever is larger)
Q
30pF and over : Q
≧
350
10pF and over, 30pF and below : Q
≧
275+5C/2
C:Nominal Capacitance(pF)
I.R.
More than 1,000MΩ
Table A-1
■
SPECIFICATIONS AND TEST METHODS
Specification
10pF and below : Q
≧
200+10C
C:Nominal Capacitance(pF)
10pF and below : Q
≧
200+10C
High Temperature
Step
Temp.(
C)
Time (min)
1
Min.
Operating Temp.+0/-3
30±3
2
Room Temp
2 to 3
3
Max.
Operating Temp.+3/-0
30±3
4
Room Temp
2 to 3
Char.
Nominal Values
(ppm/
C) Note 2
Capacitance Change from 25
C (%)
-55
-30
-10
Max.
Min.
Max.
Min.
Max.
Min.
5C
0
30
0.
58
-0.24
0.40
-0.17
0.25
-0.11
Note2:Nominal values denote the temperature coefficient within a range of 25
℃
to 125
℃
(for 5C)
Char.
Nominal Values
(ppm/
C) Note 1
Capacitance Change from 20
C (%)
-55
-25
-10
Max.
Min.
Max.
Min.
Max.
Min.
2C
0
60
0.82
-0.45
0.49
-0.27
0.33
-0.18
Note1:Nominal values denote the temperature coefficient within a range of 20
℃
to 125
℃
(for 2C)
JEMCNS-0022C
3
