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4.18 Probe Delay Calibration
Every probe has a delay line between the transducer element and the coupling
face. This means that the initial pulse must first pass through this delay line
before the sound wave can enter the test object. You can compensate for this
influence of the delay line in the function P-DELAY.
If the value for P-DELAY is not known, read Chapter 5 in order to determine this
value.
4.19 Setting the Angle of Incidence
The ANGLE function enables you to adjust the angle of incidence of your probe
for the material used. This value is required for the automatic calculation of the
flaw position. The angle of incidence for the straight-beam probe is fixed to 0
°
.
Adjustment range: 0
°
~80
°
4.20 Magnifying the Contents of a Gate
Whenever an A-Scan is active, pressing the
key enlarges the displayed
portion of the A-Scan contained in the selected gate. Any of the available gates
may be specified as the selected gate. The width of the magnified gate
determines the level of magnification since the display is magnified until the
gate width equals the full-screen width. The display will contain the magnified
view until pressing
again.
Before Magnifying
After Magnifying
4.21 Freezing the A-Scan Display
Whenever an A-Scan is active, pressing
freezes the A-Scan display. The
active A-Scan will remain as it appeared when
was pressed and the display
will remain frozen until
is pressed again.
4.22 Setting the Display Grid
- Activate the SYS submenu (located in the CFG menu) by pressing the
menu key below it. Three functions will appear down the right side of the
display screen.
- Press the function key next to the selection titled GRID.
- To change the grid type, continue pressing the function key or turn the
knob. Each grid style is shown in the display screen
’
s A-Scan window as
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