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FLIM Data Acquisition
9. Start the FLIM
λ
stack acquisition with the image acquisition button
Run FLIM
.
In LAS AF, you obtain a
λ
stack of averaged images and, in SymPhoTime, a series of FLIM
images.
16.3.9
Defining an xy
Λ
or xz
Λ
FLIM Stack
These modes are only available for systems that are equipped with variable-frequency
lasers (white light lasers, MP lasers). In the following, the acquisition of xy or xz FLIM
stacks with the white light laser is described:
1. Select the specimen position.
2. In
Beam Path Settings
in the white light laser dialog, select the mode
Constant Power
Figure 144:
Selecting the Constant Power mode
3. In the
Setup FLIM
step on the
Setup
tab, select the option
Internal (SP FLIM)
or
External
4. In the
Measurements
step on the
Acquisition
tab, select either the
Acquisition Mode
xy
Λ
or
xz
Λ
as the scan mode.
5. Check that the correct detector for the FLIM measurement is activated in the
Λ
stack
dialog.
6. Optimize the instrument parameter setting for FLIM measurement. While doing so, test
different excitation wavelengths.
7. Define a file name in the
Setup
tab (
).
8. Open the
Acquisition
tab. If you want to use a spectral internal FLIM detector, select it
in the
PMT Selection field (Figure 146
). If you remove the check next to
Automatic SP
Movement
, you can manually select the external detector manually with white light or
MP laser excitation in
Beam Path Settings
.
Λ
Λ
Содержание TCS SP8 SMD
Страница 1: ...10 Living up to Life User Manual Leica TCS SP8 SMD for FCS FLIM and FLCS ...
Страница 4: ...4 Copyright ...
Страница 14: ...14 Contents ...
Страница 18: ...18 Intended Use ...
Страница 20: ...20 Liability and Warranty ...
Страница 28: ...28 General Safety Notes ...
Страница 32: ...32 Additional Notes on Handling the System ...
Страница 44: ...44 System Overview and Properties ...
Страница 60: ...60 SMD Components Figure 31 DSN 102 Dual SPAD Power Supply ...
Страница 80: ...80 Safety Features ...
Страница 102: ...102 Switching On the System ...
Страница 116: ...116 LAS AF ...
Страница 214: ...214 Changing the Specimen ...
Страница 216: ...216 Changing the Objective ...
Страница 218: ...218 Piezo Focus on an Upright Microscope Figure 186 Piezo focus controller Figure 187 Spacer on objective ...
Страница 238: ...238 Switching Off the System ...
Страница 242: ...242 Repairs and Service Work ...
Страница 244: ...244 Maintenance ...
Страница 246: ...246 Disassembly and Transport ...
Страница 248: ...248 Disposal ...
Страница 254: ...254 Contact ...
Страница 256: ...256 Recommended Literature ...
Страница 266: ...266 Appendix Figure 225 Declaration of conformity ...
Страница 268: ...268 Appendix ...
Страница 269: ......