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FLIM Data Acquisition
Figure 138:
Defining a single FLIM image
7. In the
Defining FLIM Image acquisition time
dialog, you can define the duration of the
acquisition of the individual image (
). To improve FLIM data statistics, multiple
scanning operations are normally carried out with the specimen and the data is compiled
into a final image. The following alternative options are possible:
•
Duration of each image
: You can enter how long the data acquisition of an individual
FLIM image is to last. The corresponding number of scanning operations are carried
out on the specimen. The entered duration is corrected automatically so that a
scanning operation is always stopped at the end of an image.
•
Repetitions
: Enter the number of scans to be carried out.
•
Acquire until max ___ photons/pixel
: With this option, the data acquisition is not
stopped at a fixed point in time. Image acquisition ends if the brightest pixel contains
more photons than specified here. With this option, images with comparable
brightness and therefore comparable photon statistics can be acquired.
8. Start FLIM measurement by clicking on the image acquisition button
Run FLIM
.
In LAS AF, an image averaged across the entire measurement duration is shown.
16.3.4
Defining an xyz or xzy FLIM Stack
To acquire an FLIM stack, proceed as follows:
1. Select the specimen position.
2. In the
Setup FLIM
step on the
Acquisition
tab, select either the
Acquisition Mode xyz
or
xzy
as the scan mode (
). Optimize the instrument parameter setting for FLIM
measurement.
3. Go to the
Measurements
step in the FLIM Wizard.
) in the
Setup
tab.
5. Open the
Acquisition
tab.
Содержание TCS SP8 SMD
Страница 1: ...10 Living up to Life User Manual Leica TCS SP8 SMD for FCS FLIM and FLCS ...
Страница 4: ...4 Copyright ...
Страница 14: ...14 Contents ...
Страница 18: ...18 Intended Use ...
Страница 20: ...20 Liability and Warranty ...
Страница 28: ...28 General Safety Notes ...
Страница 32: ...32 Additional Notes on Handling the System ...
Страница 44: ...44 System Overview and Properties ...
Страница 60: ...60 SMD Components Figure 31 DSN 102 Dual SPAD Power Supply ...
Страница 80: ...80 Safety Features ...
Страница 102: ...102 Switching On the System ...
Страница 116: ...116 LAS AF ...
Страница 214: ...214 Changing the Specimen ...
Страница 216: ...216 Changing the Objective ...
Страница 218: ...218 Piezo Focus on an Upright Microscope Figure 186 Piezo focus controller Figure 187 Spacer on objective ...
Страница 238: ...238 Switching Off the System ...
Страница 242: ...242 Repairs and Service Work ...
Страница 244: ...244 Maintenance ...
Страница 246: ...246 Disassembly and Transport ...
Страница 248: ...248 Disposal ...
Страница 254: ...254 Contact ...
Страница 256: ...256 Recommended Literature ...
Страница 266: ...266 Appendix Figure 225 Declaration of conformity ...
Страница 268: ...268 Appendix ...
Страница 269: ......