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LANGER
EMV-Technik
DE-01728 Bannewitz
[email protected]
www.langer-emv.com
P1401/P1501 and P1402/P1502 set
3 Start-up and measurement
The P1401/P1501 or P1402/P1502 IC test system can be used to measure the immunity of
integrated circuits (ICs) to magnetic and electric fields in the frequency range of up to 1 GHz and
3 GHz, respectively. The immunity to electric fields and magnetic fields is measured separately.
The basic measurement set-up, the measurement princple and a description of the individual
components of the test systems can be found in section 2.
Measuring devices
3.1
The ICE1 test environment and P1401/P1501 or P1402/P1502 IC test system from
Langer EMV-Technik GmbH are used to carry out immunity measurements. In addition, the
following devices are needed for the measurement set-up:
Signal generator
to generate a test signal
RF power amplifier
to generate the required power
Directional coupler (optional) to measure the forward and reverse power
Spectrum analyzer (optional) to monitor the signal at the measurement output of the field
source
Oscilloscope
to monitor the functions and/or signals of the IC
PC
to automate the measurement
Note: Since the field sources are operated under short-circuit conditions or under open-circuit
conditions, as described in section 2, the power amplifier is terminated and operated with the
respective mismatch. The power amplifier used in this set-up must be designed for this purpose,
i.e. it must be stable under open-circuit conditions and short-circuit proof.
Test board
3.2
The test IC must be put into operation for the measurement. A test board for the specific IC thus
has to be manufactured for the following tasks:
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Provision of the signals and supply voltages required for test IC operation
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Provision of connections for devices such as an oscilloscope to monitor the operation condition
and/or detect faults
For further information on manufacturing the test board, please refer to IEC 62132-1 and the
"IC test instructions"
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available on request (
