5.3.2 IOPS
Test Setup : Intel E420 + 1G DDRS + ASUS P5K SE Main Board
OS: Windows XP SP2
Benchmarking software: IO Meter 2006.07.27
5.3.3 Access Time
Random access time : 0.1msec
Test Setup : Intel Core Due E8400 + 2G DDRS + ASUS P5BSE Main Board
OS: Windows XP SP2
Benchmarking software: HD TACH 3.0.1.0
5.4 Reliability
5.4.1 Wear-Leveling
KSSDP-VA Series SSD applies Static, and Dynamic wear leveling algorithms to endure
the NAND flash memory blocks under same wearing level.
5.4.2 ECC
Building ECC ( Error Correction Code ) correct 6bits per 528 Bytes
5.4.3 Endurance
5.4.4 Data Retention
Data retention above 10 years @ 25C
5.4.5 MTBF
MTBF (Mean Time Between Failure) > 1,000,000 Hours
5.4.6 Bad block management
Advanced the bad block management can replace the bad blocks with reserved blocks
available automatically.
6. Electrical Specification
6.1 Pin Assignment
6.1.1 Reserved Pin Assignment
Access Type
IOPS ( IO operation per second )
512B
4K
Random Read
7000
4600
Random Write
630
350
Sequential Read
11000
6200
Sequential Write
12000
8400
Capacity
16G
32G
64G
Read
unlimited
unlimited
unlimited
Write
>50years@
150G/day
>50years@
300G/day
>50years@
600G/day