12
LIN-JF
Overview of the Test System
Device test system
This section provides a typical example of a device test system using this product.
Single-phase 2 kVA: JIS harmonic test, IEC flicker test
Single-phase 2 kVA, three-phase 6 kVA: JIS harmonic test, IEC
flicker test
Component
Model and function
AC power supply
PCR2000LE
Impedance
LIN1020JF
The use of impedance is optional for JIS C61000-3-2(2005) and
later. The BYPASS function is used on the LIN1020JF.
Z1: JIS 100 V harmonic test
Z2: JIS 200 V harmonic test
Z3: IEC flicker test
Power analyzer
KHA3000
V
±
SOURCE
LOAD
INPUT
OUTPUT
OUTPUT
V
±
V
±
LIN3020JF
PCR-LE
KHA3000
EUT
U
L
L
N
N
G
SENSING
SENSING
L1
L2
L3
N
L
N
G
G
V
A
V
A
V
A
L(U)
G
N
N
N
L(U)
N
N
N
Component
Model and function
AC power supply
Three PCR2000LEs
Impedance
LIN3020JF or a combination of a LIN1020JF and OP01-LIN1020JF
The use of impedance is optional for JIS C61000-3-2(2005) and
later. The BYPASS function is used on the LIN3020JF or the combi-
nation of a LIN1020JF and OP01-LIN1020JF.
Z1: JIS 100 V harmonic test
Z2: JIS 200 V harmonic test
Z3: IEC flicker test
Power analyzer
KHA3000
Содержание LIN Series
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