TK-3302
28
ADJUSTMENT
Item
Condition
Measurement
Adjustment
Specifi cations / Remarks
Test-
equipment
Unit
Terminal
Unit
Parts
Method
6. QT Fine
Deviation
[Wide
5k]
1) TEST CH: Center, Low, High
(3 points)
Deviation meter fi lter
LPF: 3kHz
HPF: OFF
PTT:
ON
Power
meter
Deviation
meter
Oscilloscope
AG
AF VTVM
ANT
SP/MIC
connector
FPU
0.75kHz
±40Hz
[Wide 4k]
2) TEST CH: Center
PTT:
ON
0.60kHz
±40Hz
[Narrow]
3) TEST CH: Center
PTT:
ON
0.38kHz
±40Hz
7. DQT Fine
Deviation
[Wide 5k]
1) TEST CH: Center, Low, High
(3 points)
Deviation meter fi lter
LPF: 3kHz
HPF: OFF
PTT:
ON
0.75kHz
±40Hz
[Wide 4k]
2) TEST CH: Center
PTT:
ON
0.60kHz
±40Hz
[Narrow]
3) TEST CH: Center
PTT:
ON
0.38kHz
±40Hz
Receiver Section
Item
Condition
Measurement
Adjustment
Specifi cations / Remarks
Test-
equipment
Unit
Terminal
Unit
Parts
Method
1. BPF Wave
Adjust
E,T
1) Center frequency
Spectrum analyzer setting
Center-f: 455MHz
Span: 200MHz
RBW: 100kHz
VBW: 10kHz
ATT: 15dB
2) High-edge frequency
Spectrum analyzer setting
Center-f: 470MHz
3) Low-edge frequency
Spectrum analyzer setting
Center-f: 440MHz
SSG
Spectrum
analyzer
TX-RX
ANT
BPF
FPU
Adjust the waveform
as shown to the Fig.
1~3.
E3
1) Center frequency
Spectrum analyzer setting
Center-f: 415MHz
Span: 200MHz
RBW: 30kHz
VBW: 30kHz
ATT: 10dB
2) High-edge frequency
Spectrum analyzer setting
Center-f: 430MHz
3) Low-edge frequency
Spectrum analyzer setting
Center-f: 400MHz
Adjust the waveform
as shown to the Fig.
4~6.