S540 Power Semiconductor Test System Administrative Guide
Section 2: S540 site preparation and installation
S540-924-01 Rev. D / January 2019
2-21
Noise interference
: To prevent electrical noise from interfering with measurements, the ambient AC
magnetic field must not exceed 2 × 10
-3
G (2 × 10
-7
T):
Avoid locating the S540 next to plasma etchers, large motors, magnets, RF transmitters,
equipment with flash lamps, and other potential sources of interference
Position equipment to avoid routing signal and power cables near sources of electrical noise
Triaxial connector handling and avoiding contamination
Keep source-measure triaxial cable connectors (if applicable) clean and free of any foreign
contaminants. Do not touch the connector pins of the triaxial connectors. Contamination can cause
current leakage in the source-measure signal paths to the device under test (DUT), which can
significantly degrade the test results.
Do not touch any connector pins or the areas adjacent to the electrical contacts of the triaxial
connectors; contamination will degrade the performance of the test system.
Cleaning
: Use lint-free swabs moistened with methanol or isopropyl alcohol to clean contaminated
connectors and then blow-dry them with nitrogen gas. After blowing dry, wait several minutes before
using.
Lockout and tagout
For maximum safety while power is applied, always perform a lockout and tagout procedure. Remove
power from the entire test system and discharge capacitors before connecting or disconnecting
cables or any instrument, including the device under test. When you perform lockout and tagout
procedures, make sure that you read all warning labels on the cabinet and instruments (see the
following figure).
Figure 25: Hazardous warning label
