Section 3: Test subroutine library reference
S530 Parametric Test System Test Subroutine Library User's Manual
3-58
S530-907-01 Rev. A / September 2015
resv
This subroutine measures two-terminal resistance (force V, measure I).
Usage
double resv(int
hi
, int
lo
, int
sub
, double
v
)
hi
Input
The HI pin of the device
lo
Input
The LO pin of the device
sub
Input
The substrate pin of the device
v
Input
The forced voltage, in volts
Returns
Output
The calculated resistance:
1.0E+20 = Measured current is < 10 pA
4.0E+21 = Measured current is within 98 % of the 200 mA current
limit
Details
This subroutine calculates the resistance of a two-terminal resistor by forcing a specified voltage and
measuring the resulting current.
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
Source-measure units (SMUs)
SMU1: Forces V, maximum current limit, measures I
Example
result = resv(hi, lo, sub, v)
Schematic