S530 Parametric Test System Test Subroutine Library User's Manual
Section 3: Test subroutine library reference
S530-907-01 Rev. A / September 2015
3-45
Example
result = iebo(e, b, c, s, vebo, vsub)
Schematic
idvsvg
This subroutine measures drain-source current (I
DS
) when gate-source voltage (V
GS
) is swept and drain-source
voltage (V
DS
) and forced substrate bias voltage (V
BS
) are held constant.
Usage
void idvsvg(int
d
, int
g
, int
s
, int
sub
, double
vlow
, double
vhigh
, double
vds
,
double
vbs
, int
npts
, double
*id
, double
*vg
);
d
Input
The drain pin of the device
g
Input
The gate pin of the device
s
Input
The source pin of the device
sub
Input
The substrate pin of the device
vlow
Input
The start of the V
GS
sweep, in volts
vhigh
Input
The end the V
GS
sweep, in volts
vds
Input
The forced drain voltage, in volts
vbs
Input
Substrate bias, in volts
npts
Input
The number of points in the sweep
id
Output
The array of measured I
DS
values
vg
Output
The array of calculated V
GS
values
Details
If a zero or negative substrate pin is specified, the substrate is left floating. If the pin number is
greater than 0 and V
BS
is less than 0.9 mV, the substrate is grounded. In all other cases, it is
connected and forced.
V/I polarities
N-cV
low
, +V
high
, +V
DS
, -V
BS
P-channel -V
low
, -V
high
, -V
DS
, -V
BS
