Section 3: Test subroutine library reference
S530 Parametric Test System Test Subroutine Library User's Manual
3-24
S530-907-01 Rev. A / September 2015
Source-measure units (SMUs)
(on page 3-76) subroutine.
Example
Result = deltl1(d1, g1, s1, sub1, l1, d2, g2, s2, sub2, l2, vlow, vhigh, vds,
vbs, ithr, vstep, npts, &kflag)
deltw1
This subroutine estimates the gate width reduction parameter (
W) for a MOSFET using two values of threshold
voltage (V
T
) obtained from the
vtext2
subroutine.
Usage
double deltw1(int
d1
, int
g1
, int
s1
, int
sub1
, double
w1
, int
d2
, int
g2
, int
s2
,
int
sub2
, double
w2
, double
vlow
, double
vhigh
, double
vds
, double
vbs
, double
ithr
, double
vstep
, int
npts
, int
*kflag
)
d1
Input
The drain pin of Q1
g1
Input
The gate pin of Q1
s1
Input
The source pin of Q1
sub1
Input
The substrate pin of Q1
w1
Input
The drawn gate width of Q1, in microns
d2
Input
The drain pin of Q2
g2
Input
The gate pin of Q2
s2
Input
The source pin of Q2
sub2
Input
The substrate pin of Q2
w2
Input
The drawn gate width of Q2, in microns
vlow
Input
Start of the gate-source voltage (V
GS
) search, in volts
vhigh
Input
End of the V
GS
search, in volts
vds
Input
Drain bias, in volts
vbs
Input
Substrate bias, in volts
ithr
Input
Drain-source trigger current (I
DS
), in amperes
vstep
Input
V
GS
step size, in volts
npts
Input
Number of points in the V
GS
sweep
kflag
Output
Returned status flag:
0 = Normal completion
1 = First V
T
measurement failed
2 = Second V
T
measurement failed
Returns
Output
Estimated gate width reduction