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manufacturing/testing of electronic assemblies. The test fixture is connected to an existing test
system. The electronic assemblies to be tested are connected within the test fixture and are then
tested or programmed. An replacement kit (ATS) suitable for the electronics to be tested is in
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stalled in the test fixture. The test fixture must be operated only with original Ingun ATSs.
5)
Liability in the event of misuse
INGUN assumes no liability for damages caused due to non-compliance with the operating in
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structions, or a lack of testing to ensure that of the test adapter is in a technically perfect and safe
condition.
6)
Commissioning the test fixture
Before initial connection to the test system, check interface compatibility thoroughly, paying par
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ticular attention to the pinout for the test system.
7)
Commissioning the replacement set (ATS)
We recommend checking the contacts on the electronic assembly beforehand. When commis
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sioning the ATS, ensure that all positions on the retention clamp have been verified as having ad
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equate clearance to the components.
IMPORTANT
Risk of component damage!
Due to positional tolerances, retention clamps may come into contact with components or
press down on them and damage the test specimen.
Check all retention clamp positions to verify they have adequate clearance!
If clearance is insufficient, use retention clamps with a smaller diameter, or alternatively
readjust/remove the retention clamps.
8)
Operation – ATS installation/removal (see Fig. 2)
Before installing the replacement kit into the test fixture, ensure that both replacement parts (probe
plate unit and pressure frame unit) match both each other and the test specimen.
1) Insert the probe plate unit into the lower part of the test fixture from above
2) Place the pressure frame unit into the opened frame
3) Place the front part of the frame into the mounting bracket
4+5) Tighten the fixing screws
9)
Operation – testing (see Fig. 3)
The contacting stroke is generated by the operator by pushing down the pressure frame.
1) Insert the electronic assembly to be test in the correct position
2) Close test fixture (A)
3) Begin test and wait for test to end
4) Open test fixture (B) and (C)
5) remove tested electronic assembly
10) Maintenance – test probe inspection/replacement
The spring-loaded test probes are subject to very different loads. A reliable signal transmission is
possible only with fully functional test probes. Conditions for a good quality of contact are:
no dirt on the contact head
no excessive wear of the tips on the contact head
no drag marks on the piston of the test probe
no abrasion dust below the test probe
tight fit of the test probe in the receptacle
Содержание MA 160
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