
User Guide EVAL-1ED020I12F2-DB
13 of 28
v1.0
2021-06-21
EVAL-1ED020I12F2-DB user guide
Isolated driver daughter board to evaluate 1200 V CoolSiC™ MOSFET
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Figure 7
Motherboard equipped wit daughterboard and SiC MOSFET´s for low-side measurements
Especially in this configuration (wiring of the load) the arrangement can be used for low-side measurements.
Power switch Q2 is now the DUT (device under test).
A configuration for high-side measurements is shown in Chapter 4.1.3.
X202
Gate_LS
Gate_HS
1
ED
020
I12
-F
2
DESAT
OUT
CLAMP
EVAL-1ED020I12F2-DB
(daughter board)
High-side
Low-side
R
Gate
R
DESAT
0
C
DESAT
R
Gate
R
DESAT
0
C
DESAT
D
DESAT
D
DESAT
1
ED
020
I12
-F
2
DESAT
OUT
CLAMP
D
G
S
D
G
S
V
DC
X200
X201
X101
+
-
Load
X150
X151
X152
R
Shunt
X105
X102
800 V
+
-
12 V
+ 12V
+
VD
C
GND1
M
id
p
o
in
t
(p
h
a
s
e
)
G
N
D
-Se
c
µController
Evaluation platform
(mother board)
Q1
Q2
phase