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IEEE 1149.1 Test Access Port (JTAG)
Freescale Semiconductor
35-7
Figure 35-5. TAP Controller State Machine Flow
35.4.3
JTAG Instructions
describes public and private instructions.
Table 35-5. JTAG Instructions
Instruction
IR[4:0]
Instruction Summary
IDCODE
00001
Selects IDCODE register for shift
SAMPLE/PRELOAD
00010
Selects boundary scan register for shifting, sampling, and preloading without
disturbing functional operation
SAMPLE
00011
Selects boundary scan register for shifting and sampling without disturbing
functional operation
RUN-TEST/IDLE
TEST-LOGIC-RESET
1
1
SELECT DR-SCAN
CAPTURE-DR
EXIT1-DR
PAUSE-DR
UPDATE-DR
SELECT IR-SCAN
SHIFT-DR
EXIT2-DR
CAPTURE-IR
SHIFT-IR
EXIT1-IR
PAUSE-IR
EXIT2-IR
UPDATE-IR
0
0
1
1
0
0
0
1
1
1
0
0
0
1
1
0
0
1
1
0
1
0
1
1
0
1
1
0
0
1
0
Содержание MCF54455
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