Manual # 26-6092936-00 / Revision A
VFC-2100DE
– Scaler with Digital Effects
23
Horizontal Phase
The horizontal phase adjustment allows the user to advance or delay the VFC encoded composite signal in relation to
the Genlock signal.
Output Test Pattern
The
OUT TEST PATTERN
menu shown above allows the user to place a test pattern on the main output device. This
menu is also used to choose the type and/or invert the test pattern. A test pattern box and grid can also be enabled
and disabled from within this menu.
Output Test Pattern Mode
Pressing the
ON/+
or
OFF/-
key while the
MODE
field is bracketed will enable (
ON
) or disable (
OFF
) the test pattern
on the main output screen. The currently selected test pattern is displayed when test pattern is enabled. While the
test pattern is enabled,
T
P
will be displayed in the lower left corner of the main menu (see section 6.3). While the test
pattern is on, COLOR BARS test pattern type will be displayed on the preview monitors (Outputs #2 and #3).
Output Test Pattern Type
Pressing the
ON/+
or OFF/- key while the
TYPE
field is bracketed will allow the user to scroll through the available
test patterns. The name of the test pattern will be display within the TYPE field. If the test pattern mode is enabled,
the test pattern displayed reflects the currently selected test pattern. The following test patterns can be selected:
VER GRILL
HOR GRILL
XOR BURST
VER BURST
HOR BURST
COLOR BARS
VER GRAY
HOR GRAY
BLACK
Inverting Output Test Pattern
Pressing the
ON/+
or OFF/- key while the
INVERT
field is bracketed will allow the user to enable (
ON
) or disable
(
OFF
) the inversion of the test pattern and grid if enabled (see below).
Grid Test Pattern
Pressing the
ON/+
or OFF/- key while the
GRID
field is bracketed will allow the user to enable (
ON
) or disable (
OFF
)
the grid test pattern. When enabled, the grid will display over the currently selected test pattern. To view the grid
pattern on a white background, set the
TYPE
field to
BLACK
and enable the
INVERT
option described above.
Raster Test Pattern Box
Selecting the
BOX
field and pressing the
ON/+
key enables the test pattern box. Pressing the
OFF/-
key while this
field is bracketed will disable the test pattern box. The box will be displayed on the main output device. The size of
the box is determined by the output configuration and can be used to size and place the image correctly on the
screen.
OUT TEST PATTERN
MODE <AAA>
TYPE < AAAAAAAAAAA>
INVERT <AAA>
GRID <AAA>
RASTER BOX <AAA>
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