
Appendix
ET
System
electronic
GmbH
49
ET
‐
System
Rippel
Measurment
Specification
Theoretical
Analysis
The
component
of
the
output
ripple
is
built
by
the
output
current
and
the
equivalent
series
resistor
of
the
output
capacitor.
Picture
1
show
a
basic
circuit
which
was
used
to
simulate
the
ripple.
Picture
2
show
the
ripple
without
spikes.
Picture
2
shows
also
the
different
between
the
used
measurement
bandwidth.
At
this
example
the
switching
frequency
of
the
converter
was
80kHz
(this
is
also
the
switching
frequency
of
the
LAB/HP
and
LAB/SMS
series).The
red
line
shows
the
measured
ripple
by
using
a
bandwidth
of
20MHz
and
the
blue
line
shows
the
measured
ripple
by
using
a
measure
bandwidth
of
300kHz.
This
example
shows
that
the
measurement
bandwidth
have
a
strong
influence
of
the
measurement
result.
The
spike
or
noise
of
the
ripple
will
generate
by
the
switching
noise
of
the
power
supply.
The
spikes
which
will
be
measured
strongly
depend
on
the
used
measurement
method.
One
point
is
the
using
measurement
bandwidth
the
other
point
is
the
test
setup.
The
influence
of
the
measurement
method
is
show
at
picture
4.
Picture
3
show
the
previous
know
circuit
and
also
the
same
circuit
with
some
added
leakage
component
how
are
contribute
to
the
output
noise.
This
example
show
that
the
measurement
bandwidth
do
influence
the
spikes
or
noise
measurement.
Содержание LAB-HP
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