BIOS Quick Reference • CC5-RAVE
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EKF Elektronik GmbH * Philipp-Reis-Str. 4 * D-59065 HAMM (Germany)
Tel. +49 (0)2381/6890-0 * Fax. +49 (0)2381/6890-90 * E-Mail [email protected] * Internet http://www.ekf.de
Standard Diagnostics Routines Setup Screen
Embedded systems may require automated burn-in testing in the development cycle. This facility
is provided directly in the system’s system BIOS through the Standard Diagnostics Routines Setup
Screen. To use the system, selectively enable or disable features to be tested, and then enable the
“Tests Begin on ESC?” option to cause the system test suite to be invoked. To repeat the system
test battery continuously, you should also enable the “Continuous Testing” option. When
continuous testing is started, the system will continue until an error is encountered. Caution: The
disk I/O diagnostics perform write operations on those drives; therefore, only spare drives should
be used which do not contain data that could be harmed by the test. Caution: The keyboard test
may fail when in fact the hardware is operating within reasonable limits. This is because
although the device may produce occasional errors, the BIOS retries operations when failures
occur during normal operation of the system.
