
DW1000 User Manual
© Decawave Ltd 2017
Version 2.12
Page 61 of 242
Step
Number
Instruction
Register
Address
Data
Length
(Bytes)
Data
(Write/Read)
C-15
Write Sub-Register
0x2D:06 (OTP_CTRL)
1
0x00
Configure OTP for Programming – Stage 3:
C-16
Write Sub-Register
0x2D:07 (O1)
1
0x01
C-17
Write Sub-Register
0x2D:00 (OTP_WDAT)
2
0x1024
C-18
Write Sub-Register
0x2D:06 (OTP_CTRL)
1
0x08
Wait 1ms
C-19
Write Sub-Register
0x2D.07 (O1)
1
0x00
Programming a single 32 bit word <DATA> to address <ADDR>:
P-1
Write Sub-Register
0x2D:06 (OTP_CTRL)
1
0x00
P-2
Write Sub-Register
0x2D:00 (OTP_WDAT)
4
<DATA[31:0]>
P-3
Write Sub-Register
0x2D:04 (OTP_ADR)
2
<ADDR[10:0]>
P-4
Write Sub-Register
0x2D:06 (OTP_CTRL)
1
0x40
P-5
Write Sub-Register
0x2D:06 (OTP_CTRL)
1
0x00
Wait 1 ms before reading back to verify
After programming an OTP word, it should be read back using the procedure in
and verified for correctness. If it does not match the expected value, then the steps P-4
through P-5 should be repeated up to a maximum of 10 times (the address and data values in the registers
will still be valid and as such do not require re-programming). During the programming stages the OTP is
configured to stress the read-back circuits to their limits. This may result in continuous read-verify failures. In
the event that 10 attempts have been made to programme a location then a final read-verify is
recommended after a full IC reset, this will reset the OTP configuration to normal read operation.
When all OTP programming is finished it is recommended to reset the IC to revert back to the default
settings.
6.3.3
Reading a value from OTP memory
The OTP memory may be read by following the steps given in Table 13.
Table 13: An example of register accesses required to read from OTP
Step
Number
Instruction
Register
Address
Data
Length
(Bytes)
Data
(Write/Read)
1
Write Register
0x2D:04 (OTP_ADDR)
2
OTP Address
2
Write Sub-Register
0x2D:06 (OTP_CTRL)
1
0x03
3
Write Sub-Register
0x2D:06 (OTP_CTRL)
1
0x00
4
Read Register
0x2D:0A (OTP_RDAT)
4
OTP Read Value
6.4 Measuring IC temperature and voltage
The DW1000 is equipped with a low speed 8-bit SAR A/D convertor which can be configured to sample
values from an internal IC temperature sensor and also from a battery voltage monitor on the VDDAON