Document Number: 002-00948 Rev. *C
S29CD032J
S29CD016J
S29CL032J
S29CL016J
15. Test Conditions
Figure 16. Test Setup
16. Test Specifications
Table 21. Key to Switching Waveforms
16.1
Switching Waveforms
Figure 17. Input Waveforms and Measurement Levels
Table 20. Test Specifications
Test Condition
All Options
Unit
Output Load
1 TTL gate
Output Load Capacitance, C
L
(including jig capacitance)
30
pF
Input Rise and Fall Times
5
ns
Input Pulse Levels
0.0V – V
IO
V
Input timing measurement reference levels
V
IO
/2
V
Output timing measurement reference levels
V
IO
/2
V
Waveform
Inputs
Outputs
Steady
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High-Z)
C
L
Device
Under
Test
V
IO
V
SS
V
IO
/2 V
V
IO
/2 V
Output
Measurement Level
Input