CY7C1354C
CY7C1356C
Document #: 38-05538 Rev. *G
Page 17 of 28
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on V
DD
Relative to GND........ –0.5V to +4.6V
Supply Voltage on V
DDQ
Relative to GND ...... –0.5V to +V
DD
DC to Outputs in Tri-State ................... –0.5V to V
DDQ
+ 0.5V
DC Input Voltage ................................... –0.5V to V
DD
+ 0.5V
Current into Outputs (LOW)......................................... 20 mA
Static Discharge Voltage........................................... > 2001V
(per MIL-STD-883, Method 3015)
Latch-up Current..................................................... > 200 mA
Operating Range
Range
Ambient
Temperature
V
DD
V
DDQ
Commercial
0°C to +70°C
3.3V
–5%/+10% 2.5V – 5%
to
V
DD
Industrial
–40°C to +85°C
Electrical Characteristics
Over the Operating Range
[14, 15]
Parameter
Description
Test Conditions
Min.
Max.
Unit
V
DD
Power Supply Voltage
3.135
3.6
V
V
DDQ
I/O Supply Voltage
for 3.3V I/O
3.135
V
DD
V
for 2.5V I/O
2.375
2.625
V
V
OH
Output HIGH Voltage
for 3.3V I/O, I
OH
=
−
4.0 mA
2.4
V
for 2.5V I/O, I
OH
=
−
1.0 mA
2.0
V
V
OL
Output LOW Voltage
for 3.3V I/O, I
OL
=
8.0 mA
0.4
V
for 2.5V I/O, I
OL
=
1.0 mA
0.4
V
V
IH
Input HIGH Voltage
for 3.3V I/O
2.0
V
DD
+ 0.3V
V
for 2.5V I/O
1.7
V
DD
+ 0.3V
V
V
IL
Input LOW Voltage
[16]
for 3.3V I/O
–0.3
0.8
V
for 2.5V I/O
–0.3
0.7
V
I
X
Input Leakage Current
except ZZ and MODE
GND
≤
V
I
≤
V
DDQ
–5
5
µ
A
Input Current of MODE Input = V
SS
–30
µ
A
Input = V
DD
5
µ
A
Input Current of ZZ
Input = V
SS
–5
µ
A
Input = V
DD
30
µ
A
I
OZ
Output Leakage Current GND
≤
V
I
≤
V
DDQ,
Output Disabled
–5
5
µ
A
I
DD
V
DD
Operating Supply
V
DD
= Max., I
OUT
= 0 mA,
f = f
MAX
= 1/t
CYC
4-ns cycle, 250 MHz
250
mA
5-ns cycle, 200 MHz
220
mA
6-ns cycle, 166 MHz
180
mA
I
SB1
Automatic CE
Power-down
Current—TTL Inputs
Max. V
DD
, Device Deselected,
V
IN
≥
V
IH
or V
IN
≤
V
IL
, f = f
MAX
= 1/t
CYC
4-ns cycle, 250 MHz
130
mA
5-ns cycle, 200 MHz
120
mA
6-ns cycle, 166 MHz
110
mA
I
SB2
Automatic CE
Power-down
Current—CMOS Inputs
Max. V
DD
, Device Deselected,
V
IN
≤
0.3V or V
IN
> V
DDQ
−
0.3V,
f = 0
All speed grades
40
mA
I
SB3
Automatic CE
Power-down
Current—CMOS Inputs
Max. V
DD
, Device Deselected,
V
IN
≤
0.3V or V
IN
> V
DDQ
−
0.3V,
f = f
MAX
= 1/t
CYC
4-ns cycle, 250 MHz
120
mA
5-ns cycle, 200 MHz
110
mA
6-ns cycle, 166 MHz
100
mA
I
SB4
Automatic CE
Power-down
Current—TTL Inputs
Max. V
DD
, Device Deselected,
V
IN
≥
V
IH
or V
IN
≤
V
IL
, f = 0
All speed grades
40
mA
Notes:
14. Overshoot: V
IH
(AC) < V
DD
+1.5V (Pulse width less than t
CYC
/2), undershoot: V
IL
(AC)> –2V (Pulse width less than t
CYC
/2).
15. T
Power-up
: Assumes a linear ramp from 0V to V
DD
(min.) within 200 ms. During this time V
IH
< V
DD
and V
DDQ
<
V
DD
.
16. Tested initially and after any design or process changes that may affect these parameters.
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