Cypress Semiconductor Perform CY62146E MoBL, Руководство пользователя

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CY62146E MoBL
®
Document Number: 001-07970 Rev. *D Page 4 of 11
Figure 2. AC Test Loads and Waveforms
Parameters 5.0V Unit
R1 1800
Ω
R2 990
Ω
R
TH
639
Ω
V
TH
1.77 V
Data Retention Characteristics
Over the Operating Range
Parameter Description Conditions Min Typ
[2]
Max Unit
V
DR
V
CC
for Data Retention 2 V
I
CCDR
[6]
Data Retention Current
V
CC
= 2V, CE > V
CC
– 0.2V,
V
IN
> V
CC
– 0.2V or V
IN
< 0.2V
1 7
μ
A
t
CDR
[7]
Chip Deselect to Data
Retention Time 0 ns
t
R
[8]
Operation Recovery Time t
RC
ns
Figure 3. Data Retention Waveform
V
CC
V
CC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10%
90%
10%
Rise Time = 1 V/ns
Fall Time = 1 V/ns
OUTPUT V
Equivalent to: THÉ VENIN EQUIVALENT
ALL INPUT PULSES
R
TH
R1
TH
Notes
7. Tested initially and after any design or process changes that may affect these parameters.
8. Full device operation requires linear V
CC
ramp from V
DR
to V
CC(min)
> 100
μ
s or stable at V
CC(min)
> 100
μ
s.
V
CC(min)
V
CC(min)
t
CDR
V
DR
> 2.0V
DATA RETENTION MODE
t
R
V
CC
CE
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