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CY7C1353G

Document #: 38-05515 Rev. *E

Page 3 of 13

Pin Definitions

 

Name

IO

Description

A

0

, A

1

, A

Input-

Synchronous

Address Inputs used to select one of the 256K address locations

. Sampled at the rising edge 

of the CLK. A

[1:0]

 are fed to the two-bit burst counter.

BW

[A:B]

Input-

Synchronous

Byte Write Inputs, Active LOW

. Qualified with WE to conduct writes to the SRAM. Sampled on 

the rising edge of CLK.

WE

Input-

Synchronous

Write Enable Input, Active LOW

. Sampled on the rising edge of CLK if CEN is active LOW. This 

signal must be asserted LOW to initiate a write sequence.

ADV/LD

Input-

Synchronous

Advance/Load Input

. Used to advance the on-chip address counter or load a new address. When 

HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a new 

address can be loaded into the device for an access. After being deselected, ADV/LD must be 

driven LOW to load a new address.

CLK

Input-Clock

Clock Input

. Used to capture all synchronous inputs to the device. CLK is qualified with CEN. CLK 

is only recognized if CEN is active LOW.

CE

1

Input-

Synchronous

Chip Enable 1 Input, Active LOW

. Sampled on the rising edge of CLK. Used in conjunction with 

CE

2

, and CE

3

 to select/deselect the device.

CE

2

Input-

Synchronous

Chip Enable 2 Input, Active HIGH

. Sampled on the rising edge of CLK. Used in conjunction with 

CE

and CE

3

 to select/deselect the device. 

CE

3

Input-

Synchronous

Chip Enable 3 Input, Active LOW

. Sampled on the rising edge of CLK. Used in conjunction with 

CE

1

 and

 

CE

to select/deselect the device.

 

OE

Input-

Asynchronous

Output Enable, asynchronous input, Active LOW

. Combined with the synchronous logic block 

inside the device to control the direction of the IO pins. When LOW, the IO pins are allowed to 

behave as outputs. When deasserted HIGH, IO pins are tri-stated, and act as input data pins. OE 

is masked during the data portion of a write sequence, during the first clock when emerging from 

a deselected state, when the device has been deselected. 

CEN

Input-

Synchronous

Clock Enable Input, Active LOW

. When asserted LOW the Clock signal is recognized by the 

SRAM. When deasserted HIGH the Clock signal is masked. While deasserting CEN does not 

deselect the device, CEN can be used to extend the previous cycle when required.

ZZ

Input-

Asynchronous

ZZ “sleep” Input

. This active HIGH input places the device in a non-time critical “sleep” condition 

with data integrity preserved. During normal operation, this pin has to be low or left floating. ZZ pin 

has an internal pull down.

DQ

s

IO-

Synchronous

Bidirectional Data IO Lines

. As inputs, they feed into an on-chip data register that is triggered by 

the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified 

by address during the clock rise of the read cycle. The direction of the pins is controlled by OE and 

the internal control logic. When OE is asserted LOW, the pins can behave as outputs. When HIGH, 

DQ

and DQP

[A:B]

 are placed in a tri-state condition. The outputs are automatically tri-stated during 

the data portion of a write sequence, during the first clock when emerging from a deselected state, 

and when the device is deselected, regardless of the state of OE.

DQP

[A:B]

IO-

Synchronous

Bidirectional Data Parity IO Lines

. Functionally, these signals are identical to DQ

s

. During write 

sequences, DQP

[A:B]

 is controlled by BW

correspondingly.

MODE

Input

Strap Pin

MODE Input. Selects the burst order of the device. 

When tied to Gnd selects linear burst sequence. When tied to V

DD

 or left floating selects interleaved 

burst sequence.

V

DD

Power Supply

Power supply inputs to the core of the device

V

DDQ

IO Power 

Supply

Power supply for the IO circuitry

V

SS

Ground

Ground for the device

NC,NC/9M,

NC/18M,

NC/36M

NC/72M, 

NC/144M, 

NC/288M,

No Connects

. Not internally connected to the die. NC/9M, NC/18M, NC/72M, NC/144M, NC/288M, 

are address expansion pins are not internally connected to the die.

[+] Feedback 

Содержание CY7C1353G

Страница 1: ... every clock cycle This feature dramatically improves the throughput of data through the SRAM especially in systems that require frequent Write Read transitions All synchronous inputs pass through input registers controlled by the rising edge of the clock The clock input is qualified by the Clock Enable CEN signal which when deasserted suspends operation and extends the previous clock cycle Maximu...

Страница 2: ...A DQA NC NC VSS VDDQ NC NC NC NC NC NC VDDQ VSS NC NC DQB DQB VSS VDDQ DQB DQB NC VDD NC VSS DQB DQB VDDQ VSS DQB DQB DQPB NC VSS VDDQ NC NC NC A A CE 1 CE 2 NC NC BW B BW A CE 3 V DD V SS CLK WE CEN OE NC 18M A A 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 ...

Страница 3: ... of a write sequence during the first clock when emerging from a deselected state when the device has been deselected CEN Input Synchronous Clock Enable Input Active LOW When asserted LOW the Clock signal is recognized by the SRAM When deasserted HIGH the Clock signal is masked While deasserting CEN does not deselect the device CEN can be used to extend the previous cycle when required ZZ Input As...

Страница 4: ...ed sufficiently A HIGH input on ADV LD increments the internal burst counter regardless of the state of chip enable inputs or WE WE is latched at the beginning of a burst cycle Therefore the type of access Read or Write is maintained throughout the burst sequence Single Write Accesses Write access are initiated when these conditions are satisfied at clock rise CEN is asserted LOW CE1 CE2 and CE3 a...

Страница 5: ... X X X L H X X L L L H Data Out Q NOP DUMMY READ Begin Burst External L H L L L H X H L L H Tri State DUMMY READ Continue Burst Next X X X L H X X H L L H Tri State WRITE Cycle Begin Burst External L H L L L L L X L L H Data In D WRITE Cycle Continue Burst Next X X X L H X L X L L H Data In D NOP WRITE ABORT Begin Burst None L H L L L L H X L L H Tri State WRITE ABORT Continue Burst Next X X X L H...

Страница 6: ... BWB Read H X X Write No bytes written L H H Write Byte A DQA and DQPA L L H Write Byte B DQB and DQPB L H L Write All Bytes L L L Note 9 Table only lists a partial listing of the byte write combinations Any combination of BW A D is valid Appropriate write is based on which byte write is active Feedback ...

Страница 7: ... 5V IO 1 7 VDD 0 3V V VIL Input LOW Voltage 10 for 3 3V IO 0 3 0 8 V Input LOW Voltage 10 for 2 5V IO 0 3 0 7 V IX Input Leakage Current except ZZ and MODE GND VI VDDQ 5 5 µA Input Current of MODE Input VSS 30 µA Input VDD 5 µA Input Current of ZZ Input VSS 5 µA Input VDD 30 µA IOZ Output Leakage Current GND VI VDDQ Output Disabled 5 5 µA IDD VDD Operating Supply Current VDD Max IOUT 0 mA f fMAX 1...

Страница 8: ...ndard test methods and procedures for measuring thermal impedance according to EIA JESD51 30 32 C W ΘJC Thermal Resistance Junction to Case 6 85 C W AC Test Loads and Waveforms Note 12 Tested initially and after any design or process changes that may affect these parameters OUTPUT R 317Ω R 351Ω 5 pF INCLUDING JIG AND SCOPE a b OUTPUT RL 50Ω Z0 50Ω VT 1 5V 3 3V ALL INPUT PULSES VDDQ GND 90 10 90 10...

Страница 9: ...5 0 5 ns tALH ADV LD Hold after CLK Rise 0 5 0 5 ns tWEH WE BWX Hold After CLK Rise 0 5 0 5 ns tCENH CEN Hold After CLK Rise 0 5 0 5 ns tDH Data Input Hold After CLK Rise 0 5 0 5 ns tCEH Chip Enable Hold After CLK Rise 0 5 0 5 ns Notes 13 This part has a voltage regulator internally tPOWER is the time that the power needs to be supplied above VDD minimum initially before a read or write operation ...

Страница 10: ...ence is determined by the status of the MODE 0 Linear 1 Interleaved Burst operations are optional WRITE D A1 1 2 3 4 5 6 7 8 9 CLK tCYC tCL tCH 10 CE tCEH tCES WE CEN tCENH tCENS BW A B ADV LD tAH tAS ADDRESS A1 A2 A3 A4 A5 A6 A7 tDH tDS DQ COMMAND tCLZ D A1 D A2 Q A4 Q A3 D A2 1 tDOH tCHZ tCDV WRITE D A2 BURST WRITE D A2 1 READ Q A3 READ Q A4 BURST READ Q A4 1 WRITE D A5 READ Q A6 WRITE D A7 DESE...

Страница 11: ... See truth table for all possible signal conditions to deselect the device 24 DQs are in high Z when exiting ZZ sleep mode Switching Waveforms READ Q A3 4 5 6 7 8 9 10 A3 A4 A5 D A4 1 2 3 CLK CE WE CEN BW A B ADV LD ADDRESS DQ COMMAND WRITE D A4 STALL WRITE D A1 READ Q A2 STALL NOP READ Q A5 DESELECT CONTINUE DESELECT DON T CARE UNDEFINED tCHZ A1 A2 Q A2 D A1 Q A3 tDOH Q A5 tZZ I SUPPLY CLK ZZ tZZ...

Страница 12: ...press Semiconductor All product and company names mentioned in this document are the trademarks of their respective holders Ordering Information Not all of the speed package and temperature ranges are available Please contact your local sales representative or visit www cypress com for actual products offered Speed MHz Ordering Code Package Diagram Part and Package Type Operating Range 133 CY7C135...

Страница 13: ...values on the Thermal Resistance table Updated the Ordering Information by shading and unshading MPNs according to availability C 418633 See ECN RXU Converted from Preliminary to Final Changed address of Cypress Semiconductor Corporation on Page 1 from 3901 North First Street to 198 Champion Court Modified test condition from VIH VDD to VIH VDD Modified test condition from VDDQ VDD to VDDQ VDD Mod...

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