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Alpha 21264/EV67 Hardware Reference Manual
Testability and Diagnostics
11–1
11
Testability and Diagnostics
This chapter describes the 21264/EV67 user-oriented testability and diagnostic fea-
tures. These features include automatic power-up self-test, Icache initialization from
external serial ROMs, and the serial diagnostic terminal port.
The boundary-scan register, which is another testability and diagnostic feature, is listed
in Appendix B. The boundary-scan register is compatible with IEEE Standard 1149.1.
This chapter is organized as follows:
•
Test pins
•
SROM/serial diagnostic terminal port
•
IEEE 1149.1 port
•
TestStat_H pin
•
Power-up self-test and initialization
•
Notes on IEEE 1149.1 operation and compliance
The 21264/EV67 has several manufacturing test features that are used only by the fac-
tory, and they are beyond the scope of this chapter.
11.1 Test Pins
The 21264/EV67 test access ports include the IEEE 1149.1 test access port, a dual-pur-
pose SROM/Serial diagnostic terminal port, and a test status output pin. Table 11–1 lists
the test access port pins.
Table 11–1 Dedicated Test Port Pins
Pin Name
Type
Function
Tms_H
Input
IEEE 1149.1 test mode select
Tdi_H
Input
IEEE 1149.1 test data in
Trst_L
Input
IEEE 1149.1 test logic reset
Tck_H
Input
IEEE 1149.1 test clock
Tdo_H
Output
IEEE 1149.1 test data output
SromData_H
Input
SROM data/Diagnostic terminal data input
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