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Rev 1.0 06/08/2004
Released
Literature # ADS-xxxx04
The System ACE has been programmed with test code that is described in Section 4.0. Table 13 describes the various
configuration modes available by setting the appropriate jumper/mode select.
Configuration
Mode
M2
JP1
(1-2)
M1
JP1
(3-4)
M0
JP1
(5-6)
* Master serial
OPEN
OPEN
OPEN
Slave serial
JUMPERED
JUMPERED
JUMPERED
Master SelectMAP
OPEN
JUMPERED
JUMPERED
Slave SelectMAP
JUMPERED
JUMPERED
OPEN
Boundary-scan JUMPERED OPEN JUMPERED
* = Default assembled state
Table 13 – Virtex-II Power-up Configuration Modes
Specific instructions on how to use the different methods of configuration are included in Section 2.2 of this manual.
4.0 Test
Designs
The following section describes the test designs that are programmed into the System ACE MPM device. These designs are
used to test the functionality of the board. Some of the tests require additional test apparatus to perform the testing. If the
System ACE has been erased, the MPM file containing the test designs is on the Virtex-II Development Kit CD. Most of the
test designs use a terminal session as the user interface. Using a straight-through serial cable, connect the Virtex-II
Development board to a PC. Open a terminal session and configure it for 19200 baud, 8 data bits, no parity, 1 stop bit and no
flow control (19200-8-N-1-N). First select the desired test design by installing jumpers on JP103 according to the Table 14
below and then press the “SW1” push button on the board to load the design.
Jumpers across pins
Test File Selected
SystemAce
Address
5-6
3-4
1-2
“000”
OFF
OFF
OFF
On-board Flash Test
“001” OFF
OFF
ON
PCI
Test
“010” OFF
ON
OFF
Switch/LED
Test
“011” OFF
ON
ON
Avbus
Connector
Test
“100”
ON
OFF
OFF
DDR SDRAM Test
“101”
ON OFF
ON Empty
“110” ON
ON
OFF
Empty
“111” ON ON ON Empty
Table 14 – System ACE Test Designs