10
CAMELIACOL 4M Color Digital Camera
5302C–IMAGE–03/04
Specification in darkness
Note:
Adjacent columns in darkness are tolerated.
Specification Under
Illumination
The test is carried out under illumination so that the most sensitive channel is at 80% of
the saturation level.
Blemishes are tested under white light and column defects are tested under green light
(P20).
Notes:
1. A maximum of 100 blemishes with an area between 1 x 1 and 2 x 2 is accepted but
the total number of pixels affected by blemishes is below 140.
2. Inside an area of 3 x 3 pixels, there is a maximum of 5 defective pixels.
3. There are no specifications on column linearity. Two defective columns must be sepa-
rated by a minimum number of two good pixels.
Table 6. Specifications in Darkness
Type
Defects
Blemish threshold
90 ADU >
α
> 45 ADU
α
> 90 ADU
Maximum number of pixels
affected by blemishes
Area maximum (in pixels)
150
3 x 3
20 (among the 150)
1 x 1
Column threshold
45 ADU >
α
> 12 ADU
α
> 45 ADU
Maximum number of column
defects
10
0
Table 7. Specifications under Illumination
Type (White or Black
Defects at 80% x VSAT
Blemish threshold
[
α
] > 50%
Maximum number of pixels affected by
blemishes
140
Maximum number of blemishes
Area maximum (in pixels)
100
(1)
2 x 2
4
3 x 3
(2)
or 2(X) x 4(Y)
Column threshold 1
[
α
] > 50%
Maximum number of column defects
(columns greater than threshold 1)
25
(3)
Column threshold 2
[
α
] > 4%
Maximum number of column defects
(columns greater than threshold 2)
50 (including the 25)
