Artesyn BajaPPC-750, Руководство пользователя

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10-34 BajaPPC-750: Monitor
May 2002
10.8 Test Commands
The following on-card functional tests are available to be run any time you desire.
The nonvolatile configuration memory can be used to enable or disable the exe-
cution of these tests on power-up and reset (see the
nvdisplay monitor com-
mand’s Misc group in Table 10-3).
The results of the tests are stored at an offset of 0x60 in NVRAM. To read the
PASS/FAIL flags, do four byte reads from the ROM at 0x60, 0x61, 0x62, and 0x63.
The byte at 0x60 should contain the magic number 0xa5 indicating that the
device is functional and that PASS/FAIL reporting is supported. The values for the
long word when a failure occurs are listed in Table 10-4.
10.8.1 itctest
itctest
tests the operation and accuracy of each of the two counter/timers in
both modes. In timer mode, it sets the timer for 100 milliseconds and verifies
that a single interrupt occurs 100 milliseconds later. In counter mode, the test
counts 100 interrupts at 1-millisecond intervals.
DEFINITION
int ITCtest(void)
10.8.2 ethertest
ethertest
checks all the logic necessary to interface the Ethernet controller to
the PCI bus in the following manner:
• Assures that the Ethernet controller self test can be run without error.
• Performs a data line test to ensure that all data line connectivity is intact.
• Verifies that data can be transferred successfully with the 82C501 in loopback
mode.
Table 10-4. Test Command PASS/FAIL Flags
Test Value Read on Failure Monitor Command
Console Serial Port 0xa5000001 serialtest
Counter/Timer 0xa5000002 itctest
Cache 0xa5000010 cachetest
NVRAM 0xa5000020 nvramtest
Ethernet Port 0xa5000080 ethertest
Download Serial Port 0xa5000100 serialtest