6
6
.
.
4
4
C
C
r
r
y
y
s
s
t
t
a
a
l
l
O
O
s
s
c
c
i
i
l
l
l
l
a
a
t
t
o
o
r
r
C
C
i
i
r
r
c
c
u
u
i
i
t
t
S
S
e
e
t
t
u
u
p
p
f
f
o
o
r
r
C
C
h
h
a
a
r
r
a
a
c
c
t
t
e
e
r
r
i
i
z
z
a
a
t
t
i
i
o
o
n
n
The following setup was used to measure the open loop voltage gain for crystal
oscillator circuits. The feedback resistor serves to bias the circuit at its quiescent
operating point and the AC coupling capacitor, Cs, is much larger than C1 and C2.
Figure 6.1 Crystal Oscillator Circuit Setup for Characterization
6
6
.
.
5
5
E
E
S
S
D
D
T
T
e
e
s
s
t
t
R
R
e
e
s
s
u
u
l
l
t
t
s
s
Test Description:
ESD Testing was performed on a Zapmaster system using the
Human-Body –Model (HBM) and Machine-Model (MM), according to MIL_STD 883
and EIAJ IC_121 respectively.
Human-Body-Model stress devices by sudden application of a high voltage
supplied by a 100 PF capacitor through 1.5 Kohm resistance.
Machine-Model stresses devices by sudden application of a high voltage
supplied by a 200 PF capacitor through very low (0 ohm) resistance
Test circuit & condition
Zap Interval : 1 second
Number of Zaps : 3 positive and 3 negative at room temperature
Critera : I-V Curve Tracing
Table 6.4 ESD Data
Model
Model
S/S
TARGET
Results
HBM
Vdd, Vss, I/C
15
2000V
TBD
MM
Vdd, Vss, I/C
15
200V
TBD
AU9228 USB KVM Controller V1.01W
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